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《Semiconductor Optoelectronics》 2004-04
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Research on Measurement of Roundness Errors Based on CCD Image

CHEN Xiang-wei, WANG Long-shan, LIU Qing-min, CUI Zhi (College of Mechanical Science and Engineering, Jilin University, Changchun 130025, CHN)  
A new non-contact measurement system of the roundness errors based on CCD image is presented. The non-contact measurement principle making use of image measurement technology is introduced. The main measurement approaches include the image preprocessing, image binarization, edge detection, system calibration and calculation of size, etc. The components of the system, the key technology and the actual measuring experiment are explained. The reason of the error margin creation is analyzed. The results of the practical measurement show that this method is correct and feasible.
【Fund】: 吉林省科技发展计划资助项目(20020632)
【CateGory Index】: TP274.4
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