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《Semiconductor Optoelectronics》 2006-02
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Characteristic of Linear CCD Image and Its Applicability of Identify Arithmetic

XU Xiao-qiu,QIN Yu-fang,HUANG Jie(College of Manufacturing Science and Engineering,Sichuan University,Chengdu 610065,CHN)  
Aimed at the problem that it's difficult to improve the identify precision of the linear CCD scan image,the influence of scan movement on image quality is deeply analyzed,and the key reason resulting in the bad identify precision is pointed out,i.e.,non uniformity of row spacing and the bad repetition of scan location.Based on that,the methodto search the edge spot along the pixel array orientation and to identify the coordinate of the circle center by curve fitting is proposed.This method avoided the influence of scan row spacing on identify precision.It is testified that this method is efficient and the identify precision can arrive at sub-pixel level.
【Fund】: 四川省科技厅应用基础研究项目(04Gy029-003-6);; 四川大学青年基金资助项目
【CateGory Index】: TP391.41;TN386.5
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【Secondary References】
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2 LIU Li-yang,XIANG Ji(School of Electrical Engineering,Zhejiang University,Hangzhou 310027,China);Online classifying system based on image for shaped floor ceramic tiles[J];Transducer and Microsystem Technologies;2012-06
3 ;Research on Image Algorithms for Glass Thickness Measurement[J];Industrial Control Computer;2013-06
4 LIAO Zhi-fei;LIU Hai-gang;CHEN Qing-wei;LIANG Zhi-quan;School of Information Engineering, Wuyi University;;Design of the control system for two-wheel self-balancing smart cars based on linear CCD[J];Electronic Design Engineering;2014-20
5 LIU Cheng-yin;ZHAO Ji-wen;College of Electrical Engineering and Automation,Anhui University;;Vehicle identification system based on linear CCD[J];Journal of Anhui University(Natural Science Edition);2015-01
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7 Duan Qiqiang Zhang Yue Chen Xianya Ding Guilin(School of Mechanical Engineering,Jiangsu University,Zhenjiang,Jiangsu 212013,China);Design of Compact Infrared Panoramic Lens[J];Laser & Optoelectronics Progress;2010-06
8 Mao Wenhua Zhang Yinqiao Wang Hui Zhao Bo Zhang Xiaochao(Chinese Academy of Agricultural Mechanization Sciences,Beijing 100083,China);Advance Techniques and Equipments for Real-time Weed Detection[J];Transactions of the Chinese Society for Agricultural Machinery;2013-01
9 Qiao Yonglianga,He Dongjiana,Zhao Chuanyuana,Tang Jingleib (a.College of Mechanical & Electronic Engineering;b.College of Information Engineering,Northwest A&F University,Yangling 712100,China);Corn Field Weeds Recognition Based on Multi-spectral images and SVM[J];Journal of Agricultural Mechanization Research;2013-08
10 DUAN Xiao-jie1,2,DUAN Fa-jie1,LChang-rong1,ZHANG Fu-kai 1(1.State Key Lab of Precision Measuring Technology and Instruments,Tianjin University,Tianjin 300072,China;2.School of Electronics and Information Engineering,Tianjin Polytechnic University,Tianjin 300387,China);3D Defects Detection of Plate Surface Based on Digital Fringes Projection[J];Journal of Iron and Steel Research;2013-06
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