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《Semiconductor Optoelectronics》 2008-06
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Changes of Narrow Defect Mode During the Small Changes of Incident Angle

YU Zhi-ming1,ZHOU Jing2(1.Department of Physics,Lianyungang Teachers' College,Lianyungang 222006,CHN;2.Department of Physics,Beijing Normal University,Beijing 100875,CHN)  
The change of narrow defect mode under gradual changes of incident angle is studied by use of eigen matrix.It is discovered that as the incident angle gradually increases,the intensity of narrow defect mode of s(or p)polarized light at first increase,and then decreases.And after that,the wavelength of defect mode becomes slightly shorter.The whole process will be repeated by the increase of incident angle.While the incident angle is being increased,the narrow defect mode of s polarized light changes faster than that of p polarized light.Under certain incident angle,the polarization of defect mode can be changed by a slight change of incident angle.
【CateGory Index】: O734
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