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Near-field measurement system for semiconductor lasers

YU Changqing AN Yuying ZENG Xiaodong (Xidian University,Xi'an 710071,CHN)  
Based on a new far-field model and inverse source algorithm of semiconductor lasers,a system for the near-field measurement of semiconductor lasers is developed.Using this system,the far-field data can be measured automatically and then the near-field distribution will be determined accurately by numerical technique.
【CateGory Index】: TN365
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