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《SEMICONDUCTOR OPTOELECTRONICS》 1998-06
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Near-field measurement system for semiconductor lasers

YU Changqing AN Yuying ZENG Xiaodong (Xidian University,Xi'an 710071,CHN)  
Based on a new far-field model and inverse source algorithm of semiconductor lasers,a system for the near-field measurement of semiconductor lasers is developed.Using this system,the far-field data can be measured automatically and then the near-field distribution will be determined accurately by numerical technique.
【CateGory Index】: TN365
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【Citations】
Chinese Journal Full-text Database 1 Hits
1 Zeng Xiaodong and Liang Changhong(Department of Technical Physics, Xidian University, Xi'an 710071 );Efficient Method to Determine Source Distribution of Diode Lasers[J];CHINESE JOURNAL OF SEMICONDUCTORS;1996-09
【Co-citations】
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1 LIAO Ke, WANG Yong (Chongqing Optoelectronics Research Institute, Chongqing 400060, CHN);Research on Short Wavelength Optical-source Non-planar Device Structure[J];Semiconductor Optoelectronics;2003-03
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7 ZHENG You-gen,WAN Wen-lue,CHEN Yu-guang (Department of Electronic Engineering, Chongqing Institute of Technology, Chongqing 400050,China);Vector Control System Based on the Cooperating Control Principles of Frequency Modulation and Voltage Regulation[J];Journal of Chongqing Institute of Technology Management;2001-02
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China Proceedings of conference Full-text Database 1 Hits
1 Jingxin Wei Binzhen Zhang Wendong Zhang Yonghong Li North China Institute of Technology,Taiyuan,Shanxi,030051,P.R.China;THE MODULAR DESIGN AND APPLICATION OF A NOVEL DATA RECORDER[A];[C];2001
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