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《Semiconductor Technology》 2002-09
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Boundary-scan test technology

WANG Zi, LIU Hong-ming, WU De-xin(Microelectronics R &D Center, The Chinese Academy of Sciences, Beijing 100029,China )  
Boundary scan technology is an integrated and standardized method to the problem of test. It provides a solution to the test of component-functionality, board interconnection and interaction, which facilitates the debugging of system circuitry. In the essay the theory and architecture of BST will be introduced, then its application will be discussed.
【CateGory Index】: TN407
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【References】
Chinese Journal Full-text Database 1 Hits
1 ZHU Xue-bin(Guilin University of Electronic Technology,Guilin 541004,China);Fault Information Processing Test in Boundary Scan Technology Analysis[J];Computer Knowledge and Technology;2011-24
China Proceedings of conference Full-text Database 1 Hits
1 Zhao junyang Zhang zhili (The Second Artillery Engineering Institute Xi'an China 710025);JTAG Technology and Application in Flash On-line Programming[A];[C];2004
【Co-references】
Chinese Journal Full-text Database 10 Hits
1 ;The Development of USB Device Firmware[J];Journal of Anhui Institute of Education;2001-03
2 XU Ning-yi, ZHOU Zu-cheng(Department of Electronics Engineering, Tsinghua University, Beijing, 100084, China);Avalon bus and an example of SOPC system[J];Semiconductor Technology;2003-02
3 WANG Ning1,LI Gui-xiang2,YANG Jiang-ping2(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China);The strategy of testing the integrity of boundary scan test infrastructure[J];Semiconductor Technology;2003-09
4 WANG ning1,LI Gui-xiang2,ZHANG Zun-quan3(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China)(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China)(3.Department of Radar Equipment Refitting&Training, Air Force Radar Academy,Wuhan 430019 China);BSDL description of device and its application in boundary-scan test[J];Semiconductor Technology;2003-10
5 LI Gui-xiang 1,LIU Ming-yun2,YANG Jiang-ping3,XIANG Jian-tao1(1.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019,China;2.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;3.Dept of Electronics & Information Eng.,Huazhong Univ.of Sci.& Tech.Wuhan 430074 China);SRAM cluster of boundary scan interconnect testing at board level[J];Semiconductor Technology;2004-03
6 LIU Ming-yuna, LI Gui-xiangb, ZHANG Xian-zhib, YANG Jiang-pingb(Air Force Radar Academy a.Group of Graduates; b.Department of RadarSystem Engineering,Wuhan 430019, China);Research of DFT for Board Level BS Chain Based on Boundary Scan Technology[J];Semiconductor Technology;2004-11
7 TIAN Ze, ZHANG Yi-hao, YU Dun-shan, SHENG Shi-min, QIU Yu-lin (Electronics Department of Northwest University, Xi ' an 710069, China; Institute of microelectronics,Peking University, Beijing 100871,China; Microelectronics R &D Center of Chinese Academy of Sciences, Beijing 100029,China);WISHBONE IP Core Interconnection Bus[J];Semiconductor Technology;2005-01
8 WANG Ning DONG Bing(The First Aviation College of Air Force,Henan Xinyang 464000 China);The Test & Diagnosis Techniques of Part-BS Board Based on Boundary Scan[J];Semiconductor Technology;2005-12
9 Zhou Xiaoxiaa,Ni Junb,Cheng Lia,Zhi Wanjianga,Wang Zhenyua (a.Institute of Electricity & Information;b.Institute of Bio-Mechatronic Engineering,Jiangsu University,Zhenjiang 212013,China);Novel Method of Boundary-Scan Interconnection Fault Diagnosis for Digital ICs[J];Semiconductor Technology;2008-12
10 ZHOU Jia-dan1,YU Su-fen2,CHENG Shu1,MU Hong-bin1(1.No.502 Staff Room,Engineering Institute of PLA Second Artillery Forces,Xi’an 710025,China;2.Beijing Academe of Reconnaissance Design,Beijing Railroad Bureau,Beijing 100860,China);Design of Virtual Test System for Circuit Board Based on LabView[J];Ordnance Industry Automation;2005-02
【Secondary References】
Chinese Journal Full-text Database 3 Hits
1 Meng Zhi-min Chen Xiao-tian(JiangNan Institute of Computing Technology,WuXi,Jiangsu);Design of USB 2.0 Based Boundary Scan Controller[J];Electronic Technology;2011-05
2 Cai Shichuang1) Wang Xuewei1) Wang Chenggang2)(Department of Control Engineering,Naval Aeronautical and Astronautical University1),Yantai 264001)(Department of Basic Experiment,Naval Aeronautical and Astrnautical University2),Yantai 264001);Study on Test Method of Mixed Circuit Board Based on Boundary Scan[J];Ship Electronic Engineering;2011-07
3 ZHANG Jing-zhe,XIE Yong-le(School of Automation Engineering,University of Electronic Science and Technology of China,Chengdu 611731,China);A Design-for-Testability Methodology of Network Oriented Diagnostic Test for PCBs[J];Microelectronics & Computer;2010-12
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