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《Semiconductor Technology》 2003-09
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Application of pseudorandom testing in mixed-signal circuits parameter test

YE Ming-jun,YAN Xue-long,LEI jia,GUO Xue-ren(CAT Lab. Guilin University of Electronic Technology,Guilin 541004,China)  
MIXED-SIGNAL circuits are gaining popularity in various applications such astelecommunication, multimedia, etc. However, the testing problems are getting more complex.Traditionally, the analog circuit is tested by explicit functional testing: directly measured its perfor-mance parameter set Z. Long test application time and complicated test equipment are required. Thetechnology of pseudo-random to detect the mixed-signal circuits is disussed in details.
【CateGory Index】: TN707
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