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《Semiconductor Technology》 2003-10
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BSDL description of device and its application in boundary-scan test

WANG ning1,LI Gui-xiang2,ZHANG Zun-quan3(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China)(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China)(3.Department of Radar Equipment Refitting&Training, Air Force Radar Academy,Wuhan 430019 China)  
The BSDL language that describes boundary scan components is thoroughly studied,and then applied to boundary scan ATPG tools and fault diagnosis software. The method and mainpoint about the use of BSDL description in a boundary_scan test is given as an example for bound-ary-scan device EPM7128SL84.
【CateGory Index】: TN407
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【References】
Chinese Journal Full-text Database 1 Hits
1 FANG Zi-cheng, LI Gui-xiang,YANG Jiang-ping, ZHANG Xian-zhi Department of Graduate Management; Department of Early Warming Detection Equipment, AFRA, Wuhan 430019, China;Research on the Automatic Testing of Interconnect Network Based on the Boundary Scan Technique[J];Semiconductor Technology;2005-10
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【Citations】
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1 WANG Long-gang, YANG Jiang-ping, LI Gui-xiang, XU Zi-wen( Group of Graduate, AFRA, Wuhan 430019, China,.Department of Radar System Engineering, AFRA, Wuhan 430019, China);Research of VLSI Interconnection Fault Diagnosis Based on Boundary Scan[J];Journal of Air Force Radar Academy;2003-01
2 LI Gui-xiang 1 YANG Jiang-ping 2 WANG Long-gang 1 (1. Department of Radar System Engineering, AFRA Wuhan 430019) (2. Dept of Electronics & Information Eng., Huazhong Univ. of Sci. & Tech. Wuhan 430074);Design Method of PCB Built-in Test and Testing Strategy Based on Boundary Scan Technology[J];Modern Radar;2003-06
【Co-citations】
Chinese Journal Full-text Database 9 Hits
1 WANG Ning1,LI Gui-xiang2,YANG Jiang-ping2(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China);The strategy of testing the integrity of boundary scan test infrastructure[J];Semiconductor Technology;2003-09
2 WANG Ning DONG Bing(The First Aviation College of Air Force,Henan Xinyang 464000 China);The Test & Diagnosis Techniques of Part-BS Board Based on Boundary Scan[J];Semiconductor Technology;2005-12
3 ZHANG Lin,ZHOU Yongjun,LIU Chong,WU Fei(Luoyang Institute of Electro-optical Equipment,AVIC,Luoyang 471009,China);Boundary Scan Technology and Its Application in Board Level Test[J];Electronics Optics & Control;2009-02
4 ZHANG Lin,ZHOU Yongjun,WU Fei (Luoyang Institute of Electro-Optical Equipment,AVIC,Luoyang 471009,China);A Method for Loading Flash by JTAG[J];Electronics Optics & Control;2009-03
5 SHI Xianjun1,ZHOU Shaolei1,ZHANG Wenguang2,ZHOU Jie2 (1.Department of Control Engineering,NAEI; 2.Graduate Students’ Brigade of NAEI,Yantai,Shandong,264001);Application of boundary scan technique to the design for board-level test[J];Journal of Naval Aeronautical Engineering Institute;2006-02
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9 LIU Ming-yun 1,LI Gui-xiang 2,ZHANG Xian-zhi 2 (1. Graduates Group, Air Force Radar Academy, Wuhan 430019,China) (2. Department of Radar System Engineering, Air Force RadarAcademy, Wuhan 430019, China);Design Strategy of Board Level Dynamic BS Chain Based on Boundary Scan Technology[J];Modern Radar;2005-01
【Co-references】
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1 WANG Zi, LIU Hong-ming, WU De-xin(Microelectronics R &D Center, The Chinese Academy of Sciences, Beijing 100029,China );Boundary-scan test technology[J];Semiconductor Technology;2002-09
2 XU Ning-yi, ZHOU Zu-cheng(Department of Electronics Engineering, Tsinghua University, Beijing, 100084, China);Avalon bus and an example of SOPC system[J];Semiconductor Technology;2003-02
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4 LI Gui-xiang 1,LIU Ming-yun2,YANG Jiang-ping3,XIANG Jian-tao1(1.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019,China;2.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;3.Dept of Electronics & Information Eng.,Huazhong Univ.of Sci.& Tech.Wuhan 430074 China);SRAM cluster of boundary scan interconnect testing at board level[J];Semiconductor Technology;2004-03
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