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《Semiconductor Technology》 2005-12
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The Test & Diagnosis Techniques of Part-BS Board Based on Boundary Scan

WANG Ning DONG Bing(The First Aviation College of Air Force,Henan Xinyang 464000 China)  
The part-BS PCB boards composed of BS chips and non-BS chips will exist widely for a long time,how to test these boards using boundary scan technique remains a key problem.In this paper,some optimal design methods for testability were proposed firstly,and then the principle and process of boundary scan test on part-BS boards were showed by way of illustration.
【CateGory Index】: TN41
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【References】
Chinese Journal Full-text Database 10 Hits
1 WANG Ning, ZHANG Yang, WU Yi-feng (Department of Aviation Electron Engineering, the First College of Air Force, Xinyang 464000, China);Problems and Solutions in Logic Cluster Boundary Scan Test[J];Semiconductor Technology;2006-06
2 DENG Zhi-wei1,2,XU Kai1,ZHANG Tian-hong1(1.College of Energy and Power Engineering,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China;2.Aviation Motor Control System Institute,Aviation Industry Corporation of China,Wuxi 214063,China);Application of boundary scan technique in electronic controller[J];Journal of Aerospace Power;2009-04
3 YANG Sheng-kui1,ZHANG Tian-hong1,DENG Zhi-wei1,2(1.College of Energy and Power Engineering,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China;2.Aviation Motor Control System Institute,Aviation Industry Corporation of China,Wuxi 214063,China);Design of the IP soft core of JTAG controller for electronic engine controller[J];Journal of Aerospace Power;2011-01
4 Cai Shichuang1) Wang Xuewei1) Wang Chenggang2)(Department of Control Engineering,Naval Aeronautical and Astronautical University1),Yantai 264001)(Department of Basic Experiment,Naval Aeronautical and Astrnautical University2),Yantai 264001);Study on Test Method of Mixed Circuit Board Based on Boundary Scan[J];Ship Electronic Engineering;2011-07
5 CHEN Yanshen ZHANG Bo LI Yanqing(Naval Radar and Sonar Repairing Factory,Qingdao 266100);Application of Boundary-Scan Technology in Non-Boundary-Scan Devices Testing[J];Ship Electronic Engineering;2012-11
6 Chen Shouhong,Yan Xuelong,Huang Xin(School of Electronic Engineering&Automation,Guilin University of Electronic Technology,Guilin 541004,China);Research and Implement of SRAM Test Based on Boundary Scan[J];Computer Measurement & Control;2013-02
7 Hu Xiao;Tan Enmin;Chen Shouhong;Shang Yuling;School of Electronic Engineering and Automation,Guilin University of Electronic Technology;;Design of Cluster Test Based on Boundary Scan Technology and TCL Language[J];Computer Measurement & Control;2014-09
8 WANG Cheng-gang1,2LIU Yue2CAI Shi-chuang3 (1.Department of Basic Experiment,Naval Aeronautical and Astronautical University,Yantai 264001; 2.School of Optoelectronics,Beijing Institute of Technology,Beijing 100081; 3.Graduate Students' Brigade,Naval Aeronautical and Astronautical University,Yantai 264001);The Research of Test Method of FPGA Circuit Board based on Functional Modeling[J];Journal of Astronautic Metrology and Measurement;2011-01
9 CAI Shi-chuang WANG Xue-wei(Department of Control Engineering,Naval Aeronautical and Astronautical University,Yantai 264001);Study on Test Method of FPGA Circuit Board based on DFT[J];Journal of Astronautic Metrology and Measurement;2011-06
10 ZHONG Chun-li;ZHANG Ping;SHENG Yong-hong;WANG Wei;ZHU Yi;PLA Information Engineering University;;Research on Non-boundary Scan Devices' s Test Method Based on Modeling and Classification[J];Journal of Chinese Computer Systems;2014-04
【Citations】
Chinese Journal Full-text Database 4 Hits
1 Tan Enmin Guo Xueren (Computer College);BIST of a CUT Using Boundary scan Architecture in FPGA[J];JOURNAL OF GUILIN INSTITUTE OF ELECTRONIC TECHNOLOGY;2000-01
2 Guo Xueren (Dept.of Electronic Engineering, Guilin 541004, China);The Boundary Scan test ——A Main Stream Test Technology for Complex MCM[J];Journal of Guilin Institute of Electronic Technology;2000-04
3 Wen Xisen;Liu Guanjun;Li Qiongwei;Yi Xiaoshan;Research Status and Trend of Board-Level BIT Technique Based on Boundary Scan[J];AVIATION METROLOGY & MEASUREMENT TECHNOLOGY;1999-03
4 LI Gui-xiang 1 YANG Jiang-ping 2 WANG Long-gang 1 (1. Department of Radar System Engineering, AFRA Wuhan 430019) (2. Dept of Electronics & Information Eng., Huazhong Univ. of Sci. & Tech. Wuhan 430074);Design Method of PCB Built-in Test and Testing Strategy Based on Boundary Scan Technology[J];Modern Radar;2003-06
【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 WANG Ning1,LI Gui-xiang2,YANG Jiang-ping2(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China);The strategy of testing the integrity of boundary scan test infrastructure[J];Semiconductor Technology;2003-09
2 WANG ning1,LI Gui-xiang2,ZHANG Zun-quan3(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China)(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China)(3.Department of Radar Equipment Refitting&Training, Air Force Radar Academy,Wuhan 430019 China);BSDL description of device and its application in boundary-scan test[J];Semiconductor Technology;2003-10
3 WANG Ning, ZHANG Yang, WU Yi-feng (Department of Aviation Electron Engineering, the First College of Air Force, Xinyang 464000, China);Problems and Solutions in Logic Cluster Boundary Scan Test[J];Semiconductor Technology;2006-06
4 WANG Xin-feng, QIU Jing (College of Electromechanical Engineering & Automation, National University of Defence Technology,Changsha 410073, China);Intelligent Self-Diagnosis Technique for Military Electromechanical Equipments[J];Ordnance Industry Automation;2004-01
5 LIAN Guang-yao, HUANG Kao-li, CHEN Jian-hui, GAO Feng-qi, (Dept. of Missile Engineering, Ordnance Engineering College, Shijiazhuang 050003, China);Intelligent Design Technology for Testability of Complex Electronic Equipments[J];Ordnance Industry Automation;2006-08
6 TONG Jiang1,CAI Yuan-wen2,BO Wei1,REN Jiang-tao1(1.Brigade of Graduate,Institute of Command & Technology of Equipment,Beijing 101416,China;2.Dept.of Aerospace Equipment,Institute of Command & Technology of Equipment,Beijing 101416,China);Analysis of Development and Application of BIT Technology[J];Ordnance Industry Automation;2008-04
7 BO Wei,CAI Yuan-wen,TONG Jiang,REN Jiang-tao(Dept.of Space Equipment,Institute of Command & Technology of Equipment,Beijing 101416,China);Analysis of Impact from IVHM to China’s Carrier Rocket and Testing and Launching Control System[J];Ordnance Industry Automation;2009-01
8 WANG Rui-zhao,WANG Yuan-da,LU Yong-ji,LU Chao(Dept.of Aviation Mechanical Engineering,Aviation University of Air Force,Changchun 130022,China);Test Technologies and Reform of Military Aircraft Maintenance System[J];Ordnance Industry Automation;2009-02
9 HU Wen-hua1,SHANG Chao-xuan1,LI Yong-jun2(1.Dept.of Optics & Electronic Engineering,Ordnance Engineering College,Shijiazhuang 050003,China;2.Dept.of Missile Engineering,Ordnance Engineering College,Shijiazhuang 050003,China);Monitoring Points Optimization and Diagnosis Strategy in Radar BIT Based on Multi-Signal Flow Model[J];Ordnance Industry Automation;2010-06
10 ZHANG Chao1,MA Cun-bao1,SONG Dong1,XU Jia-dong2(1.School of Aeronautics,Northwestern Polytechnical University,Xi'an 710072, Shaanxi,China;2.School of Electronics and Information,Northwestern Polytechnical University, Xi'an 710072,Shaanxi,China);Built-in Test Diagnosis Strategy Design for Fault-tolerant System Based on Dynamic Fault Tree Analysis[J];Acta Armamentarii;2008-05
China Proceedings of conference Full-text Database 10 Hits
1 ZHANG Shengman CHEN Shengjian ZHOU Yan (The academy of armored forces engineering,Beijing 100072,China);Research on Optimization of Extended Interconnect Test Based On Boundary Scan Technology[A];[C];2009
2 LIN Zhi-wen~1,LI Gang~1,MA Jun-yong~2 (1.Research Center of Naval Electronic Equipment's Maintenance and Test,Beijing 102442,China; 2.Naval Navigation Equipment Repairing Factory,Qindao 266071,China);A New Integrated Diagnostics Designing Based on Multi-Signal Modeling[A];[C];2006
3 WANG Xin-ling,WANG Hong,FENG Jin-qi (AVIC Beijing Chang Cheng Aeronautical Measurement and Control Technology Research Institute,Beijing 100176,China);Realization of Interconnect Test Based on Boundary Scan Technology[A];[C];2012
4 Zhang Shengman Chen Shengjian Zhou Yan (1 the academy of armored forces engineering,Beijing 100072);Research on Optimization of Extended Interconnect Test Based on Boundary Scan Technology[A];[C];2009
5 PAN Quan JING Xiao-ning CHENG Yong-mei ZHANG Hong-cai(1.Automatic Control College,Northwestem Polytechnical University,Xi'an 710072,China;2.Engineering College,Air Force Engineering University,Xi'an 710038,China);The architecture and techniques of fault diagnostics for the new generation of operational aircraft[A];[C];2005
6 He Feng Lei Jia (Dept.of Electronic Eng,Guilin University of Electronic Technology,Guilin 541004,China);Study of netlist compile technology based on boundary-scanTP[A];[C];2007
7 Bian Chunjiang (Center for space science and applied research Chinese academy of Science,Beijing 100080,China);BIT design of aircraft electronic control system[A];[C];2007
8 Jiang Chongzhen Liu Guanjun Lü Kehong (School of Mechatronics Engineering & Automatization, National Univ. of Defense Technology Changsha, China, 410073);Study on the Test and feature extraction method for time stress[A];[C];2008
9 Shu Xiaofen Wang Xiaofeng Yu Peng (Beihang University,Department of Project System Engineering Beijing 100083 China);The Research and Realization of a BIT Testability Index Verification System[A];[C];2008
10 Liu Aili Xu Guangming Kou Kunhu Hao Dong (Department of Automatic Control Engineering Naval Aeronautical Engineering Institute Yantai 264001 China);Apply Boundary Scan Test to LXI Platform[A];[C];2008
【Co-references】
Chinese Journal Full-text Database 10 Hits
1 WANG Zi, LIU Hong-ming, WU De-xin(Microelectronics R &D Center, The Chinese Academy of Sciences, Beijing 100029,China );Boundary-scan test technology[J];Semiconductor Technology;2002-09
2 XU Ning-yi, ZHOU Zu-cheng(Department of Electronics Engineering, Tsinghua University, Beijing, 100084, China);Avalon bus and an example of SOPC system[J];Semiconductor Technology;2003-02
3 WANG Ning1,LI Gui-xiang2,YANG Jiang-ping2(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China);The strategy of testing the integrity of boundary scan test infrastructure[J];Semiconductor Technology;2003-09
4 WANG ning1,LI Gui-xiang2,ZHANG Zun-quan3(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China)(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China)(3.Department of Radar Equipment Refitting&Training, Air Force Radar Academy,Wuhan 430019 China);BSDL description of device and its application in boundary-scan test[J];Semiconductor Technology;2003-10
5 LI Gui-xiang 1,LIU Ming-yun2,YANG Jiang-ping3,XIANG Jian-tao1(1.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019,China;2.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;3.Dept of Electronics & Information Eng.,Huazhong Univ.of Sci.& Tech.Wuhan 430074 China);SRAM cluster of boundary scan interconnect testing at board level[J];Semiconductor Technology;2004-03
6 CHENG Li, WANG Zhen-yu, GAO Ping, ZHU Jun(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);The technologies and applications of DFT for VLSI[J];Semiconductor Technology;2004-05
7 TIAN Ze, ZHANG Yi-hao, YU Dun-shan, SHENG Shi-min, QIU Yu-lin (Electronics Department of Northwest University, Xi ' an 710069, China; Institute of microelectronics,Peking University, Beijing 100871,China; Microelectronics R &D Center of Chinese Academy of Sciences, Beijing 100029,China);WISHBONE IP Core Interconnection Bus[J];Semiconductor Technology;2005-01
8 Wang Ning(The First College of Air Force,Xinyang 464000,China);The Test & Diagnosis Software of Logic Cluster Based on Boundary Scanning[J];Semiconductor Technology;2006-04
9 WANG Ning, ZHANG Yang, WU Yi-feng (Department of Aviation Electron Engineering, the First College of Air Force, Xinyang 464000, China);Problems and Solutions in Logic Cluster Boundary Scan Test[J];Semiconductor Technology;2006-06
10 Xu Huiqi,Tian Yanni,Chen Wangda(Dept.of Scientific & Research,Naval Aeronautic & Astronautic University,Yantai 264001,China);Design for Testability of Missile Weapon Equipment Based on Missile Data Bus[J];Ordnance Industry Automation;2012-01
【Secondary References】
Chinese Journal Full-text Database 10 Hits
1 LIU Jiuzhou, WANG Jian(No.93325 Unit of PLA,Shenyang 110141,China);A Survey on Development of Boundary Scan Techonology[J];Electronics Optics & Control;2013-02
2 YANG Sheng-kui1,ZHANG Tian-hong1,DENG Zhi-wei1,2(1.College of Energy and Power Engineering,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China;2.Aviation Motor Control System Institute,Aviation Industry Corporation of China,Wuxi 214063,China);Design of the IP soft core of JTAG controller for electronic engine controller[J];Journal of Aerospace Power;2011-01
3 Zhang Xuefeng1,Wang Tongwei2,Wang Guolong2(1.Navy Aviation Ordnance Repair Institute,Shanghai 200436,China; 2.Beijing Aerospace Measurement & Control Corp,Beijing 100041,China);Boundary-scan Test Research for Testing and Diagnosis of Microprocessor Circuit Board[J];Computer Measurement & Control;2010-06
4 Yu Tingxiang1,Xu Pengfei2,Wang Jian1,Wang Xiangji1(1.93325 Unit of PLA,Shenyang 110141;2.93251 Unit of PLA,Qiqihaer 161000);A Research of an Extend Application of Boundry Scan Test[J];Computer Measurement & Control;2012-07
5 LI Hai-fei,YANG Xiang-yang,SHE Cheng-jun,Huang Tao(Guangzhou Ordnance Repair Factory of Air Force,Guangzhou 510500,China);A FIFO Test Method Based on Boundary Scan[J];Radar Science and Technology;2013-01
6 AN Ling-ling;Department of Electrical and Electronic Engineering,Minnan University of Science and Technology;;Design of high-performance digital circuit board testing system[J];Journal of Ningde Normal University(Natural Science);2014-03
7 Chen Shouhong;Hou Xingna;Wei Cuirong;Yan Xuelong;Guangxi Key Laboratory of Automatic Detecting Technology and Instruments,Guilin University of Electronic Technology;;Design of Boundary Scan Interconnect Test Vector Generation Based on SQLite[J];Computer Measurement & Control;2015-06
8 YU Si-qi;JING Bo;WU Zhe;YANG Zhou;DENG Sen;School of Aeronautics and Astronautics Engineering,Air Force Engineering University;;Design of airborne fuel measurement system PHM test-bed and realization of fault injection[J];China Measurement & Test;2013-05
9 Wang Qining,Li Yonghong(North University of China,School of Information and Communication Engineering,Taiyuan 030051,China);Boundary-scan test research and application for testing and diagnosis of printed circuit board with DSP[J];Electronic Test;2011-04
10 DUAN Yan-liang,WEI Ting-cun,GAO Wu,XU Wang-yang(School of Computer,Northwestern Polytechnical University,Xi′an 710065,China);Design of Extendable JTAG Controller IP Core for Mixed-signal VLSI[J];Microelectronics & Computer;2012-02
【Secondary Citations】
Chinese Journal Full-text Database 3 Hits
1 YANG Xue-xian; ZHANG Qun-ying; HAN Yue-qiu (Department of Electronics Engineering, Beijing Institute of Technology, Beijing 100081);Boundary Scan Method for Radar System Level Test[J];JOURNAL OF BEIJING INSTITUTE OF TECHNOLOGY;2000-02
2 Tan Enmin Guo Xueren (Computer College);BIST of a CUT Using Boundary scan Architecture in FPGA[J];JOURNAL OF GUILIN INSTITUTE OF ELECTRONIC TECHNOLOGY;2000-01
3 Luo Qiuming Yan Xuelong Guo Xueren (CAT ,Computer College);The Design and Simulation of the Length configurable Boundary Scan Circuit[J];JOURNAL OF GUILIN INSTITUTE OF ELECTRONIC TECHNOLOGY;1998-04
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