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《Semiconductor Technology》 2006-02
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Unified Analog-Digital Test Technology for Mixed-Signal System

CHENG Li, LI Jia-yuan, WANG Zhen-yu, LI Hua-le, HE Xing (Institute of Electricity and Information, Jiangsu University, Zhenjiang 212013, China)  
In order to solve the difficult test problems among the analogue circuit, digital circuit and memory interface modules, a unified analog-digital test technology is introduced, including the above 3 modules tests, partitioned architecture of system test, design for testability (DFT), strategy and scheme of self-test and so on. Also the interconnecting test and IDDQ test methods can provide effective solutions for the new technology.
【Fund】: 江苏省高校自然科学研究基金项目(02KJB510005)
【CateGory Index】: TN792
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【Citations】
Chinese Journal Full-text Database 5 Hits
1 GAO Ping, CHENG Li, WANG Zhen-yu, ZHU Jun, SHI Yi-qiao(Institute of Electricity & Information Engineering, Jiangsu University, Zhenjiang 212013,China);A built-in self-test technology of digital VLSI circuits[J];Semiconductor Technology;2003-09
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【Co-citations】
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1 ZHANG Yan HU Gui (HuNan College of Information, Changsha 410200, China);Development of SOC Technology in Electronic Design[J];Journal of Anyang Institute of Technology;2007-01
2 GAO Ping, CHENG Li, WANG Zhen-yu, ZHU Jun, SHI Yi-qiao(Institute of Electricity & Information Engineering, Jiangsu University, Zhenjiang 212013,China);A built-in self-test technology of digital VLSI circuits[J];Semiconductor Technology;2003-09
3 JIN Xi, DING Wen-xiang, YUN Chao(Microelectronics Lab, Dept of Physics, USTC, Hefei 230026, China);Verification and testing of IP core witha RISC architecture inside[J];Semiconductor Technology;2003-11
4 WANG Zhen-yu, CHENG Li, GAO Ping, SHI Yi-qiao, ZHU Jun(Institute of Electricity & Information Engineering, Jiangsu University, Zhenjiang 212013,China);CSP technology and its development foreground[J];Semiconductor Technology;2003-12
5 CHENG Li, WANG Zhen-yu, GAO Ping(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);Latest progresses and developments of DRAM fabrication[J];Semiconductor Technology;2004-04
6 CHENG Li, WANG Zhen-yu, GAO Ping, ZHU Jun(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);The technologies and applications of DFT for VLSI[J];Semiconductor Technology;2004-05
7 CHENG Li1, LI Chun-ming2,WANG Zhen-yu1, GAO Ping1(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);The measures of new technology & development in IC industrial chain[J];Semiconductor Technology;2004-06
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9 CHENG Li1, LI Chun-ming2, WANG Zhen-yu1, ZHU Jun1(1. Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China;2. Department of Computer, Nantong Institute of Technology, Nantong 226001, China);Several New Ion Beam Doping Technologies of Ultra-Shallow Junction for Nanometer CMOS Fabrication[J];Semiconductor Technology;2004-09
10 CHENG Li, WANG Zhen-yu, JING Liang(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);Design of SOC:A Great Revolution of Design & Technology in IC Chain[J];Semiconductor Technology;2004-12
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1 Zhou De-jian (Guilin University of Technology, Guilin 541004,China);Electric Interconnecting Technology and its Technical System[A];[C];2007
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【Co-references】
Chinese Journal Full-text Database 10 Hits
1 CHENG Li, WANG Zhen-yu, GAO Ping, ZHU Jun(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);The technologies and applications of DFT for VLSI[J];Semiconductor Technology;2004-05
2 Liu Yong (Dept. of Computer Engineering, Chengdu Electro-Mechanical College Chengdu 610031);Design of Pseudorandom Sequences with Phase Shifts for VLSI Test[J];Journal of University of Electronic Science and Technology of China;2002-06
3 YU Yun-hua1,2, SHI Yin1 ( 1. Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China; 2. College of Information and Control Engineering, University of Petroleum, Dong Ying 257061, China );Research Progress on Strategy and Techniques of Fault Testing on Digital Integrated Circuits[J];Journal of Circuits and Systems;2004-03
4 TANG Yu-lan1,TAO Wei1,YU Zong-guang 1,2 1.School of Information Technology, Southern Yangtze University,Wuxi Jiangsu 214122,China; 2.China Electronics Technology Group Corporation No.58 Research Institute,Wuxi Jiangsu 214122, China;Built-in-Self-Test Scheme for DAC in Mixed-Signal Circuit[J];Chinese Journal of Electron Devices;2006-01
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【Secondary Citations】
Chinese Journal Full-text Database 10 Hits
1 CHENG Li, LI Yan-xu, LI Chun-ming, LIU Bin, WANG Yang (1. Institute of Electricity & Information, Jiangsu University of Science & Technology, Zhenjiang 212013, China; 2. Department of Computer & Science, Nantong institute of Technology, Nantong 226001, Ch;A summary of LSI DAC developing technology[J];Semiconductor Technology;2001-06
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4 GAO Ping, CHENG Li, WANG Zhen-yu, ZHU Jun, SHI Yi-qiao(Institute of Electricity & Information Engineering, Jiangsu University, Zhenjiang 212013,China);A built-in self-test technology of digital VLSI circuits[J];Semiconductor Technology;2003-09
5 LI Ren(The 45th Research Institute,CETC,Beijing 101601,China);Semi-conductor IC cleaning technology[J];Semiconductor Technology;2003-09
6 WANG Zhen-yu, CHENG Li, GAO Ping, SHI Yi-qiao, ZHU Jun(Institute of Electricity & Information Engineering, Jiangsu University, Zhenjiang 212013,China);CSP technology and its development foreground[J];Semiconductor Technology;2003-12
7 CHENG Li, WANG Zhen-yu, GAO Ping(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);Latest progresses and developments of DRAM fabrication[J];Semiconductor Technology;2004-04
8 CHENG Li, WANG Zhen-yu, GAO Ping, ZHU Jun(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);The technologies and applications of DFT for VLSI[J];Semiconductor Technology;2004-05
9 CHENG Li1, LI Chun-ming2,WANG Zhen-yu1, GAO Ping1(Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);The measures of new technology & development in IC industrial chain[J];Semiconductor Technology;2004-06
10 CHENG Li1, LI Chun-ming2, WANG Zhen-yu1, ZHU Jun1(1. Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China;2. Department of Computer, Nantong Institute of Technology, Nantong 226001, China);Several New Ion Beam Doping Technologies of Ultra-Shallow Junction for Nanometer CMOS Fabrication[J];Semiconductor Technology;2004-09
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