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《Semiconductor Technology》 2006-04
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The Test & Diagnosis Software of Logic Cluster Based on Boundary Scanning

Wang Ning(The First College of Air Force,Xinyang 464000,China)  
The testing of logic cluster composed of non-BS chips remains a hard task in boundary scanning test technology.A test diagnosis software of logic cluster is introduced,and its principle,process and application are explained,and then its validity and reliability are proved by testing.
【CateGory Index】: TP311.52
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