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《Semiconductor Technology》 2006-04
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The Test & Diagnosis Software of Logic Cluster Based on Boundary Scanning

Wang Ning(The First College of Air Force,Xinyang 464000,China)  
The testing of logic cluster composed of non-BS chips remains a hard task in boundary scanning test technology.A test diagnosis software of logic cluster is introduced,and its principle,process and application are explained,and then its validity and reliability are proved by testing.
【CateGory Index】: TP311.52
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【References】
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1 CHEN Sheng-jian CHEN Jian XU Lei(Department of Control Engineering,Academy of Armored Force Engineering,Beijing 100072,China);Design of Cluster Test System Based on Boundary Scan Technology[J];Journal of Academy of Armored Force Engineering;2008-01
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【Citations】
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1 WANG Ning1,LI Gui-xiang2,YANG Jiang-ping2(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China);The strategy of testing the integrity of boundary scan test infrastructure[J];Semiconductor Technology;2003-09
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【Co-citations】
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1 NI Jun,YANG Jian-ning,CHENG Li,XU Li-hong (Institute of Electricity & Information, Jiangsu University, Zhenjiang 212013, China);Research on the Boundary-Scan Test Bus Fault Diagnosis and Its Strategy for VLSI[J];Semiconductor Technology;2006-08
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3 LIN Jinxiao1, CHEN Weinan2, ZHOU Xuegong2, PENG Chenglian2, WU Rongquan3 (1. School of Software, Fudan University, Shanghai 200433; 2. Department of Computing and Information Technology, Fudan University, Shanghai 200433; 3. East-China Institute of Computer Technology, Shanghai 200233);Development of Eclipse Based Boundary-scan Tester Software[J];Computer Engineering;2007-12
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【Co-references】
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1 WANG Ning1,LI Gui-xiang2,YANG Jiang-ping2(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China;(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China);The strategy of testing the integrity of boundary scan test infrastructure[J];Semiconductor Technology;2003-09
2 WANG ning1,LI Gui-xiang2,ZHANG Zun-quan3(1.Group of Graduates,Air Force Radar Academy,Wuhan 430019 China)(2.Department of Radar System Engineering,Air Force Radar Academy,Wuhan 430019 China)(3.Department of Radar Equipment Refitting&Training, Air Force Radar Academy,Wuhan 430019 China);BSDL description of device and its application in boundary-scan test[J];Semiconductor Technology;2003-10
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