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《Semiconductor Technology》 2009-05
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Evaluation of Power LED Operation Life

Gao Jinhuan,Peng Hao,Wu Hongyu,Liu Dongyue,Gao Zhaofeng,Huang Jie,Xu Lisheng(National Semiconductor Device Quality Supervise and Inspection Center,Shijiazhuang 050051,China)  
The development of power LED was summarized.Following degradation mode of LED,a practical accelerate life test method which could be used to evaluate power LED long term operation life was brought forward based on Arrhenius equation between degradation coefficient and junction temperature.With the methods above,operation life of CREE power red-light LED on the junction temperature below 80 ℃ was evaluated,and test data were processed by means of chart estimation and numerical analysis.And this research may do some advance to power LED reliability.
【CateGory Index】: TN312.8
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