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《Micronanoelectronic Technology》 2005-01
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Measurement and Characterization of Nanoparticles Size

WANG Shu-yun(Institute of Physics and Electronics,Shandong Normal University,Jinan 250014,China)  
In this paper,it gives several kinds of methods for measuring nanoparticles size,such as TEM,SEM,XRD,SAXS,SPM,laser particle size analyzer,pipette method,specific surface area,and so on. Besides,it also discusses the basic theory,process,adaptation as well as the advantages and disadvantages of the methods above are also discussed.
【CateGory Index】: TB383
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