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《Ordnance Industry Automation》 2006-06
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Experimental Research on Precision Measurement of PCB Based on Image Recognition

YAO Xiao-dong1, ZHANG Yong-hong1,2, WU Qi1,3, XUE Bo1 (1. Research Center, Shanghai Yao’s Scientific Ltd. Corp, Shanghai 200030, China; 2. Dept. of Information & Communication, Nanjing University of Information Engineering, Nanjing 210044, China; 3. School of Mechanical & Power Engineering, Shanghai Jiaotong University, Shanghai 200030, China)  
The measurement system for PCB based on image recognition is composed of CCD camera, fitting lens, image acquisition card, horizontal workstation, PC and electric control. The system adjust focus of optical lens and working distance of horizontal workstation, according to enlargement factor and measurement precision of measurement object. In condition of the fixed distance of working distance and lens’ focus, measurement of any part of PCB can be realized by adjusting X axis and Y axis of workstation.
【Fund】: 上海市大学生科技创业基金资助(P05009)
【CateGory Index】: TN41
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【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 CHEN Xiang-wei, WANG Long-shan, LIU Qing-min, CUI Zhi (College of Mechanical Science and Engineering, Jilin University, Changchun 130025, CHN);Research on Measurement of Roundness Errors Based on CCD Image[J];Semiconductor Optoelectronics;2004-04
2 BAO Li-jun,PU Zhao-bang,TANG Wen-yan(Department of Automatic Measurement and Control,Harbin Institute of Technology,Harbin 150001,CHN);Aviation Springwire Socket Measurement System Based on Computer Vision[J];Semiconductor Optoelectronics;2006-03
3 SHEN Shao-wei,YAN Shu-hua,ZHOU Chun-lei,LI E,TONG Hui-peng(College of Mechatronics Engineering and Automation,National University of Defense Technology,Changsha 410073,CHN);Research of Automatic Detection Technology of Thread Parameters Based on CCD Vision[J];Semiconductor Optoelectronics;2007-06
4 SU Zhong,XIA Yan,WU Xi-bao(Beijing Information Technology Institute,Beijing 100101,CHN);Laser Measurement of Diameter Based on Computer Vision System[J];Semiconductor Optoelectronics;2008-01
5 Zhang Lina,Han Lei(Key Laboratory of Modern Complex Equipment Design and Extreme Manufacturing,Ministry of Education,Central South University,Changsha 410083,China);Method for Eliminating the Influence of Temperature on the Alignment Precision in Flip-Chip Bonding[J];Semiconductor Technology;2008-11
6 ZHANG Xue-min, SONG Shu-wen (Dept. 2, The First Aeronautic Institute of Air Force, Xinyang 464000, China);Improvement of Two-stage Camera Calibration[J];Ordnance Industry Automation;2006-09
7 JIANG Ke-wan1,WU Qi2(1.Dept.of Electrical Engineering,Shanghai Dianji University,Shanghai 200240,China;2.School of Mechanical & Power Engineering,Shanghai Jiaotong University,Shanghai 200030,China);Application of Image Recognition Technology in PCB Precision Measurement[J];Ordnance Industry Automation;2009-02
8 ZHANG Yong-hong, HU De-jin, SONG Wei(School of Mechanical and Power Engineering, Shanghai Jiaotong University, Shanghai 200030, China);The Study on CCD Online System for Monitoring a Grinding Wheel in Process of Point Grinding on Curve Surface[J];Acta Armamentarii;2005-02
9 Chen Shiping(School of Mechanical Engineering and Automation,Beijing University of Aeronautics and Astronautics,Beijing 100083,China)Bi Ya(Hubei University of Economics,Department of Information and Economics,Wuhan 430205,China)Li XiaoXing Zhou Xianbin(School of Mechanical Engineering and Automation,Beijing University of Aeronautics and Astronautics,Beijing 100083,China);The technique of sub-pixel stripes distinguish on the surface measurement[J];Journal of Beijing University of Aeronautics and Astronautics;2006-08
10 Sun Minglei Zhang Rong(School of Mechanical Engineering and Automation,Beijing University of Aeronautics and Astronautics,Beijing 100191,China)Zhu Xiaofeng(Beijing Municipal Institute of Labour Protection,Beijing 100054,China)Zong Guanghua(School of Mechanical Engineering and Automation,Beijing University of Aeronautics and Astronautics,Beijing 100191,China);Normalized cross correlation computation for geometry image features[J];Journal of Beijing University of Aeronautics and Astronautics;2008-12
【Co-references】
Chinese Journal Full-text Database 10 Hits
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