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《Ordnance Industry Automation》 2011-11
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Research on Performance Test System in Outfield of Thermal Infrared Imager

Wang Zhensheng1,Ma Sasa2,Song Wei3(1.Ordnance Radar Repairment Place of Beijing Military,Beijing 100042,China; 2.Ordnance Technology Research Institute,Shijiazhuang 050000,China; 3.Management College,Hebei Science & Technology University,Shijiazhuang 050013,China)  
In order to meet the need of outfield thermal infrared imager performance test equipments in military,a set of the outfield of thermal infrared imager performance test system is designed.Based on several current typical test system product,through the equivalent band patterns method,the detection of thermal imaging system is predicted under various probability,the model of recognize the distance is distinguished,the detection and correction factors of various infrared equipments are determined,the accurate parameters in performance test are gotten,overall design scheme and implementation method is designed.Analysis the measured data show: the test system has certain creativity in structure design,which can meet the need of military equipments repair and guarantee and has application value.
【Fund】: 通保科研项目(装通[2009]115号)
【CateGory Index】: TJ06
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9 DING Yong-qiang,NIU Qiang-jun The First Aeronautical Institute of the Air Force,Xinyang 464000;The Development of Aero communication System Testing Equipment Based on The PXI[A];[C];2009
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