RELIABILITY STUDY ON THE DESIGN OF EXPLOSIVE LOGIC NULL GATE
Jino Qingjie ; Ji Liguo ; Cai Ruijiao (Beijing Institute of Technology, Beijing, 100081)
The mathematical model of reliability for explosive logic null gate is built up, and the reltability window and corresponding experimental data are discussed. It thus provides a basis for the desisn of explosive logic networks.
【CateGory Index】： TJ51