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《Acta Armamentarii》 2001-02
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Chang Benkang Lei Yuanqing Che Jing (Nanjing University of Science & Technology, Nanjing, 210094) Guo Liang(Yunnan Optical Instrument Factory) Cui Kaiyuan(Nanjing Xuguang Instrument Factory)  
Electrode surface compositions of MCP and the MCP of second generation image intensifiers are studied with XPS The results show that one of the equivalent background noise sources in second generation image intensifiers comes from the impurities K,Na,Cs and Pb existing on the elctrode surface of the MCP,and the impurity content attains 9 69% Pollution of alkali metal can be controled by a heater that controls the flow field of alkali metal vapor when the photocathode is prepared In this way a 5 06 signal/noise ratio for the second generation image intensifiers can be achieved
【CateGory Index】: TN144
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