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《Acta Armamentarii》 2008-05
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Built-in Test Diagnosis Strategy Design for Fault-tolerant System Based on Dynamic Fault Tree Analysis

ZHANG Chao1,MA Cun-bao1,SONG Dong1,XU Jia-dong2(1.School of Aeronautics,Northwestern Polytechnical University,Xi'an 710072, Shaanxi,China;2.School of Electronics and Information,Northwestern Polytechnical University, Xi'an 710072,Shaanxi,China)  
Complex aerospace and spaceflight system has dynamic and stochastic faults because of the wide use of various fault-tolerance technologies,the conventional fault diagnosis strategy design methods based on static failure mechanism is inappropriate to its built-in test(BIT) design.In order to solve this problem,a new method for designing BIT fault diagnosis strategy for fault-tolerant systems,considering reliability and testing costs,was proposed based on dynamic fault tree model.The costs and diagnostic importance factor(CDIF) was introduced to evaluate the influences of the test costs on the BIT diagnosis,and individual sub fault tree,binary decision diagram and Markov chain were integrated to analyze the dynamic fault tree qualitatively and quantitatively,and consequently, the BIT diagnostic decision tree is built based on minimal cut set(MCS)/sequence(MCSS) and CDIF.The application in BIT design of a certain fault-tolerant electronic system demonstrates its engineering practicability and validity.The comparison of the fault diagnosis strategy design methods among the proposed and two other methods shows that the proposed is better than those based on AO* algorithm and greed algorithm in respects of computational complexity.
【Fund】: 国家自然科学基金资助项目(60572173);; 航天创新基金资助项目(2004CH01001);; 国防科工委预研资助项目;; 西北工业大学青年科技创新基金资助项目(M016217);; 西北工业大学研究生创业种子基金资助项目(Z20040002)
【CateGory Index】: TH165.3
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