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《Journal of Beijing Institute of Machinery》 2005-04
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The design of isolation-resistance test system in electric security tester

HE Ming-song,LIU Gui-li,LI Dong,WANG Yan-lin(Department of Electronic Information Engineering,Beijing Institude of Machinery,Beijing 100085,China)  
A security tester for apparatus and instrument is designed and manufactured in order to meet the international standards of instrument and the demand of instrument development.The theory and design of isolation-resistance test system in electric security tester are introduced.The testing system,which is composed of computer system,testing circuit and MCU,meets the standard of IEC61010.The measured error is less than one per(1σ) between 0 and 2 000 MΩ. The system is centered with computer and MCU,thus facilitating its manipulation and answering the demand of instrument development.
【Fund】: 科技部科研院所专项[项目编号:2003EG119102]
【CateGory Index】: TM934.1
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