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《Journal of Gems & Gemmology》 2000-03
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PRINCIPLES AND METHODS OF EDXRF APPLICATED TO IDENTIFICATION OF GEMS AND JEWELRY

Gao Yan 1 Yang Dehui 2 Yang Juntao 1 1. (National Gemstone Testing Center, Beijing, 100013) 2. (KevexSpectrace Instruments Inc. Beijing Lab., Beijing, 100044)  
EDXEF, as a non destructive testing tool, is especially applicable to the identification of gems and jewelry. All the different types of EDXRF, from the simplest gold analyzer to the large scale EDXRF, run on the same principles and are consisted of X ray excited source, detector, sample chamber and signal and data processing systems. The technique principles of EDXRF are explained and a few types of instruments are introduced in this paper. How to develop and use EDXRF for identification of gems and jewelry is explained, and some application examples are given.
【Key Words】: EDXRF principle method gem identification
【CateGory Index】: TS93
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【References】
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【Co-references】
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1 Tang Juxing 1,Tang Jin 2, Gao Derong 1, Lin Wendi 1, Mu Jilu 1 (1. Chengdu University of Technology, China; 2. Sichuan Geology and Exploration Bureau);XRFA APPLICATION TO THE EVALUATION OF THE WITHERITE BARYTOCALCITE BARYTODOLOMITE TYPE BARIUM DEPOSIT[J];JOURNAL OF CHENGDU UNIVERSITY OF TECHNOLOGY;1999-01
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