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《Journal of Chongqing University of Post and Telecommunication (Natural Science)》 1993-01
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The Fault Diagnosing System Develepment for user SPC Switching System

Deng Yaping Wang Fangxin (Department of Computer)  
This paper adopts a method of functional testing and uses different equivalent black box- es for distinet printed circuit boards,basing on introducing the basic principles for fault diag- nosing user SPC switching system.Under these circumstances of unchanging total hard- wares,to test and diagnose these PCBs and unit circuits with software by adding a diagnosing board.The accuracy for singlePCB,a unit circuit and single IC chip,respectively,are one hun- dred per cent,above eighty per cent and about seventy per cent.
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Chinese Journal Full-text Database 4 Hits
2 LIU ZHIMO (Chongqing University);STATE VARIABLE STAR ALGORITHM AND ITS APPLICATIONS[J];Chinese Journal of Computers;1984-02
3 Chen Junliang, Lu Gang, Shi Leiqi, Yang Fangchun, Song Maoqiang and Li Dahui(Beijing University of Posts and Telecommunications);Principles of Designing Diagnosis Programs for SPC Switching Systems[J];Journal of China Institute of Communications;1988-05
4 Yang Fangchun(Beijing University of Posts and Telecommunications);A Quick Algorithm for Diagnosing Space-Division Digital Switching Network[J];Journal of China Institute of Communications;1991-06
Chinese Journal Full-text Database 10 Hits
1 FANG Xiang-Sheng~1,CHAO Xian-Xia~2(1.Anhui Economy Administration Institute,Hefei 230059,China;2.Anhui Highway Engineering Artificer School,Hefei 230051,China);Testing research for the SOC logic BIST[J];Journal of Anhui Institute of Architecture & Industry(Natural Science);2006-03
2 XU Zi-ming1,SU Yan-peng1,YU Zong-guang1,2(1.SIT of Southern Yangtze University,Wuxi 214000,China;2.The 58th Research Institute,CETC,Wuxi 214035,China);SRAM BIST Circuit Design Based on the March C-Algorithm[J];Semiconductor Technology;2007-03
3 Wan Kai Ma Qishuang Wang Peng(School of Automation Science and Electrical Engineering,Beijing University of Aeronautics and Astronautics,Beijing 100083,China);State partition technique in mixed-circuit fault diagnosis[J];Journal of Beijing University of Aeronautics and Astronautics;2007-10
4 Gao Wenchang (Department of Computer Engineering);Testable Design and Fault Diagnosis of Sequentially Written/Randomly Read Memories[J];;1991-01
5 Song Maoqiang Liang Mei (Department of Computer Engineering);RAM Test Stratagem for SPC Switching System[J];;1991-03
6 Chen Ying Sun Shuhe (Department of Computer Engineering)(Department of Telecommunication Engineering);The Dynamic Function Test of SLC and TRK[J];;1991-04
7 Gao wenchang (Department of Computer Engineering);The Fault Detection of LTSW in SPC Switching System[J];;1992-03
8 ZHANG Qing-shan 1a,ZHAO Wan-zhang 1b,ZHANG Xue-feng2(1a.Changchun Telecom Engineering Design Institute Company Limited;1b.Library,Jilin University,Changchun 130012,China;2.Jilin Branch of China Unicom Network Management Center,Changchun 130012,China);Electromagnetic Compatible and Systematic Dependability Design[J];Journal of Jilin University(Information Science Edition);2009-03
9 LI He-ping, ZOU Ming-hu, WANG Zhi-yun, HUANG Yun-hua(Optics and Electric Department, Ordnance Engineering College, Shijiazhuang 050003, China);Board-Grade Circuit Fault Quick Diagnosis in Radar Based on L-M Algorithm[J];Journal of Test and Measurement Technology;2004-04
10 WU Li-hua,WANG Zhen,Xiang Fu-jia,MA Huai-jian (College of Measure-control Technology & Communication Engineering, Harbin Univ.Sci.Tech.,Harbin 150040,China);The Research for Determining the Minim Test Set of Test Patterns Based on Fault Simulation[J];Electrical Measurement & Instrumentation;2006-10
China Proceedings of conference Full-text Database 2 Hits
1 Ning xiao-ling1 Sun cen-liang2 Cheng jiang-tao3 Qin liang4(1.2.4.Naval Aeronautical Engineering Institute,Yantai,264001;3.Naval Aeronautical Engineering Institute Qingdao Branch,Qingdao,266041);Design and Realization of Circuit Board Automatic Test Structure Based on IEEE1445[A];[C];2007
2 Du Shehui Yang Hui Fang Gefeng He Yigang (Faculty of Electrical and Information Engineering, Hunan University, Changsha, 410082, China);The analyse of integrate circuit testing standards[A];[C];2008
【Secondary Citations】
Chinese Journal Full-text Database 8 Hits
1 Yang Fangchun;Location Algorithm for Multiple Faults on the Selector[J];;1986-04
2 CHEN TlNG-HUAI (Chongqing University);FOUR-VALUED LOGIC AND STAR ALGORITHM[J];Chinese Journal of Computers;1979-04
3 LIANG YE-WEI (Changsha Institute of Technology);THE METHOD OF WHOLE PATH GRAPHS[J];Chinese Journal of Computers;1979-04
4 LIU ZHIMO (Chongqing University);STATE VARIABLE STAR ALGORITHM AND ITS APPLICATIONS[J];Chinese Journal of Computers;1984-02
5 Chen Junliang(Beijing Institute of Posts and Telecommunications);Models and Analysis of T and S Switches in Digital Switching Networks[J];Journal of China Institute of Communications;1985-03
6 Chen Junliang(Beijing Institute of Posts and Telecommunications);Fault Detection and Diagnosis of T-S-T Digital Switching Networks[J];Journal of China Institute of Communications;1985-03
7 Lu Gang and Chen Junliang (Beijing Institute of Posts & Telecommunications);An Algorithm for Testing Time Switches in Digital Switching Networks[J];Journal of China Institute of Communications;1986-03
8 Yang Fangchun and Chen Junliang(Beijing University of Posts and Telecommunications);Multiple Fault Diagnosis in T-S-T Digital Switching Networks Using Parity Checkers[J];Journal of China Institute of Communications;1988-05
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