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《Journal of Chongqing University of Post and Telecommunication (Natural Science)》 1993-01
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The Fault Diagnosing System Develepment for user SPC Switching System

Deng Yaping Wang Fangxin (Department of Computer)  
This paper adopts a method of functional testing and uses different equivalent black box- es for distinet printed circuit boards,basing on introducing the basic principles for fault diag- nosing user SPC switching system.Under these circumstances of unchanging total hard- wares,to test and diagnose these PCBs and unit circuits with software by adding a diagnosing board.The accuracy for singlePCB,a unit circuit and single IC chip,respectively,are one hun- dred per cent,above eighty per cent and about seventy per cent.
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【Citations】
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1 Liu Zhimo;AN ALGORITHM TO GENERATE SINGLE FAULT COMPLETE TEST SETS FOR REDUNDANT COMBIATIONAL CIRCUITS[J];Journal of Chongqing University(Natural Science Edition);1985-S1
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【Co-citations】
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1 FANG Xiang-Sheng~1,CHAO Xian-Xia~2(1.Anhui Economy Administration Institute,Hefei 230059,China;2.Anhui Highway Engineering Artificer School,Hefei 230051,China);Testing research for the SOC logic BIST[J];Journal of Anhui Institute of Architecture & Industry(Natural Science);2006-03
2 XU Zi-ming1,SU Yan-peng1,YU Zong-guang1,2(1.SIT of Southern Yangtze University,Wuxi 214000,China;2.The 58th Research Institute,CETC,Wuxi 214035,China);SRAM BIST Circuit Design Based on the March C-Algorithm[J];Semiconductor Technology;2007-03
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8 ZHANG Qing-shan 1a,ZHAO Wan-zhang 1b,ZHANG Xue-feng2(1a.Changchun Telecom Engineering Design Institute Company Limited;1b.Library,Jilin University,Changchun 130012,China;2.Jilin Branch of China Unicom Network Management Center,Changchun 130012,China);Electromagnetic Compatible and Systematic Dependability Design[J];Journal of Jilin University(Information Science Edition);2009-03
9 LI He-ping, ZOU Ming-hu, WANG Zhi-yun, HUANG Yun-hua(Optics and Electric Department, Ordnance Engineering College, Shijiazhuang 050003, China);Board-Grade Circuit Fault Quick Diagnosis in Radar Based on L-M Algorithm[J];Journal of Test and Measurement Technology;2004-04
10 WU Li-hua,WANG Zhen,Xiang Fu-jia,MA Huai-jian (College of Measure-control Technology & Communication Engineering, Harbin Univ.Sci.Tech.,Harbin 150040,China);The Research for Determining the Minim Test Set of Test Patterns Based on Fault Simulation[J];Electrical Measurement & Instrumentation;2006-10
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1 Ning xiao-ling1 Sun cen-liang2 Cheng jiang-tao3 Qin liang4(1.2.4.Naval Aeronautical Engineering Institute,Yantai,264001;3.Naval Aeronautical Engineering Institute Qingdao Branch,Qingdao,266041);Design and Realization of Circuit Board Automatic Test Structure Based on IEEE1445[A];[C];2007
2 Du Shehui Yang Hui Fang Gefeng He Yigang (Faculty of Electrical and Information Engineering, Hunan University, Changsha, 410082, China);The analyse of integrate circuit testing standards[A];[C];2008
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