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《Journal of Test and Measurement Technology》 2007-06
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Research on Fault Mask in the Test of FPGA

LI Xuelian1,LI Yuexiang1,YUAN Tao2 (1.School of Computer & Information Technology,Shanxi University, Taiyuan 030006,China;2.Dept.of Automation,Tsinghua University,Beijing 100084,China)  
Field Programmable Gate Arrays(FPGAs)are widely used in the hardware implementation of circuit design.Detecting the faults of FPGAs is very important.This paper presented the problem of fault mask in the test of FPGA,and focused its research on the generating reasons and conditions of fault mask.Finally,the solutions and suggestions are given to reduce its appearance and to improve the fault coverage of FPGA test.
【CateGory Index】: TN791
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【References】
Chinese Journal Full-text Database 1 Hits
1 CHEN Guiming1,CHENG Kun1,LIU Hu2,LIU Haojie3(1.Second Artillery Engineering University,Xi′an,710025,China;2,Chinese Spaceflight Era Electron Company,Xi′an,710065,China;3.PLA Sergeant College of the Second Artillery,Qingzhou,262500,China);Design for General Purpose Test System of Spare Parts[J];Modern Electronics Technique;2009-19
【Citations】
Chinese Journal Full-text Database 1 Hits
1 HUANG Wei Kang (State Key Laboratory of ASIC, Fudan University, Shanghai 200433);Testing of FPGAs[J];JOURAAL OF COMPUTER AIDED DESIGN & COMPUTER GRAPHICS;2000-05
【Co-citations】
Chinese Journal Full-text Database 3 Hits
1 ZHAO Juan1,WANG Yue-ling1,LIU Ming-feng2,YU Zong-guang1,WANG Cheng1(1.The 58th Research Institute,CECT,Wuxi 214035,China;2.Institute of Electricity,Jiangsu University,Zhenjiang 212000,China);Research on the Test of SRAM-Based FPGA[J];Semiconductor Technology;2007-09
2 ;Masking of Faults in the Testing of FPGA[J];Computer Development & Applications;2007-10
3 Jiang Haihang(Wuhan Digital Engineering Institute,Wuhan430074);Research on FPGA Mensurability Design[J];Ship Electronic Engineering;2009-01
China Proceedings of conference Full-text Database 1 Hits
1 Du Shehui He Yigang Zhang Hongbo Fu Cong Chen Jianhua Liu Wenye (Faculty of Electrical and Information Engineering, Hunan University, Changsha, 410082, China);BIST-Based Delay-Fault Testing in Dynamic Reconfiguration FPGAs[A];[C];2008
【Co-references】
Chinese Journal Full-text Database 6 Hits
1 DU Liebo,XIAO Xuemin,LU Qin,LUO Wusheng(College of Mechatronics Engineering and Automation,National University ofDefense Technology,Changsha 410073,China);An Implementation Scheme for JPEG2000 Satellite-Borne Remote Sensing Image Compression Based on FPGA+Multi-DSPs[J];Journal of Test and Measurement Technology;2008-06
2 LUO Gong-chun, HU Chang-hua, HU Xiao-xiang, PING Zhen-hai (No.302 Staff Room, The Second Artillery Engineering Institute, Xi’an 710025, China);Fault Diagnosis System of Missile Weapon Based on Virtual Testing[J];Ordnance Industry Automation;2008-01
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