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《Transactions of China Electrotechnical Society》 2007-06
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Fault Diagnosis of Analog Circuit Based on Wavelet Analysis and Clonal Selection Algorithm

Peng Liangyu1,2 Yu Wangbing1 (1. Hunan Normal University Changsha 410081 China 2. Beijing University of Aeronautics and Astronautics Beijing 100083 China)  
A new method for fault diagnosis of analog circuit based on artificial immune algorithm is presented in this paper. The proposed method uses wavelet analysis as a tool to extract the fault examples,then learns the fault examples to abtain the clustering center of each fault class,and finally localizes the fault component by calculating the distance between the fault example and the clustering centers. The simulation result shows that the proposed method has the capability to diagnose faults in tolerance circuits and achieves satisfactory accuracy.
【Fund】: 湖南省自然科学基金项目(06JJ50117);; 湖南省教育厅科研项目(05C404)。
【CateGory Index】: TN710
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