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《Electronics Optics & Control》 2007-01
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Bayes reliability assessment for k-out-of-n system based on ML-II method

CHENG Wan-min,FENG Jing,ZHOU Jing-lun,SUN Quan(Information System and Management School,NUDT,Changsha 410073,China)  
k-out-of-n system(k/nsystem) is widely used in engineering.Reliability assessment of traditional statistical method can only utilize on-the-spot test information,which may result in that long test duration and lots of samples are needed to reach the given confidence level for high reliability system.To implement reliability evaluation with few samples on the spot of test,a new method based on Bayesian theory is proposed,each sort of information,including the information of each component,should be made full use of for reliability analysis.Firstly,the distribution function of system life is deduced based on order statistics theory and the second maximum likelihood estimation for the parameters in the model are proposed.Steps to assess the system reliability are given.Examples illustrate the feasibility of the method.
【Fund】: 863高科技项目(No.2003AA845023)
【CateGory Index】: V215.7
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