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《ELECTROCHEMISTRY》 1999-03
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Spectroellipsometric Studies on Electrochemistry and its Application

Huang Zongqing * Zhang Shengtao Xie Shangfen Chen Changguo Yang Yuru Zhu Wei (Dept. of Applied Chem,Chongqing Univ.Chongquing 400044)  
Ellipsometric measurements are often extremely sensitive to the presence of very thin surface layers,to changes in their thickness(or coverage),and to changes in surface topography at an atomic scale.These characteristics make the use of ellipsometry for electrochemical studies particularly attractive.The ellipsometric studies on electrochemistry and its applications carried out in the Electrochemical Laboratory of Chongqing University are reviewed briefly: 1)The studies on electrochemistry of classical ellipsometry: 2)The new function V op suggested by the authors. 3)The applications of new approcaches with new function V op suggested by the authors.
【Fund】: 国家自然科学基金
【CateGory Index】: O646
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