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《Journal of Projectiles,Rockets,Missiles and Guidance》 2006-S3
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Design of Stored Testing and Measuring System Based on C8051F023

WANG Zhi-hao LI Dong-guang LI Hong-qi HE Guang-lin (School of Mechanic-Electronics Engineering,Beijing Institute of Technology,Beijing 100081,China)  
Compared with the stored testing and measuring system based on traditional 51 MCU.the system based on new type of MCU which contains a lot of on-chip sources has more advantages.In this paper,two kinds of designing project are analyzed,then the hardware and software design of a stored testing and measuring system based on C8051F023 MCU is discussed in detail.Experiment shows that the system is credible,fulfilling the demand of the de- sign.
【CateGory Index】: TP368.1
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【Co-citations】
Chinese Journal Full-text Database 10 Hits
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10 QI Liang1,ZHAO Mao-cheng1*,JU Rong-hua1,2,SONG Xiao-ning1,21.College of Mechanical and Electronic Engineering,Nanjing Forestry University,Nanjing 210037,China;2.Nanjing Food and Packaging Machinery Institute,Nanjing 210029,China;Capacitive Sensor Used for Inspecting Fill Level in Beverage Package[J];Chinese Journal of Sensors and Actuators;2009-01
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