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《Journal of Projectiles,Rockets,Missiles and Guidance》 2006-S3
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Design of Stored Testing and Measuring System Based on C8051F023

WANG Zhi-hao LI Dong-guang LI Hong-qi HE Guang-lin (School of Mechanic-Electronics Engineering,Beijing Institute of Technology,Beijing 100081,China)  
Compared with the stored testing and measuring system based on traditional 51 MCU.the system based on new type of MCU which contains a lot of on-chip sources has more advantages.In this paper,two kinds of designing project are analyzed,then the hardware and software design of a stored testing and measuring system based on C8051F023 MCU is discussed in detail.Experiment shows that the system is credible,fulfilling the demand of the de- sign.
【CateGory Index】: TP368.1
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