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《Journal of University of Electronic Science and Technology of China》 2005-06
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A Test Case Generating Algorithm for Pairwise Testing

XIANG Yu,ZHANG Jun,WANG Wen-yong (Information Center, UEST of China Chengdu 610054)  
Based on the research of black box testing of the embedded software, a new test case generation algorithm is proposed. This algorithm, based on the principles of pairwise testing, considers all possible values and their combinations on extern interfaces of a system. Experiments results show that this algorithm improves the efficiency of test case generation without any influence on the precision of software test.
【CateGory Index】: TP311.52
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【References】
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