Design of Fault Wave Recording Device Using High Performance Integrated Microchip
BAI Qing-gang, XIA Rui-hua, ZHOU Hai-bin, LIAO Xiao-chun (North China Electric Power University, Beijing 102206, China) (Wuhan Power Instrument Factory, Wuhan 430000, China)
With the development of techniques and electricity market, many disadvantages of the conventional fault wave recording devices such as reliability, configuration and cost, etc, have been gradually emerged. Thus a design of a new wave recording device is proposed in terms of the disadvantages above. The reliability and flexibility of the device is greatly improved with the module configuration as well the cost is reduced. Furthermore, the conventional fore-and back-ground structure mode is then thoroughly changed when the back-ground computer is thrown away in the design. Results of a great deal of experiments prove that the design is feasible and the device has unapproachable advantages in data integrality, security and telemetry.
【CateGory Index】： TM76;