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《Computer Knowledge and Technology》 2011-24
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Fault Information Processing Test in Boundary Scan Technology Analysis

ZHU Xue-bin(Guilin University of Electronic Technology,Guilin 541004,China)  
The boundary scan technology is a complete,standardized method of design fortestability,it provides a pair of elements on circuit board function,such as interconnection was tested with a unified plan,greatly improves thesystem efficiency testing.This paper introduces the boundary scan test principle,structure,discussed theapplication of boundary scan test technology.
【CateGory Index】: TN407
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