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A New Method of Linear Feature Detection Based on Beamlet Transform

ZHANG Yi,CHENG Li-zhi(Colleage of Science,National Univ.of Defense Technology,Changsha 410073,China)  
A new method of linear feature detection based on Beamlet transform is proposed,which can detect lines with any orientation,location and length.The integrity and accuracy of linear feature are kept.Experiments show that the new method is very good in vision and application and better than some traditional feature detectors.It has good prospect in its application.
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