Full-Text Search:
Home|Journal Papers|About CNKI|User Service|FAQ|Contact Us|中文
《Physical Experiment of College》 2011-01
Add to Favorite Get Latest Update

Optical Constants of MgF_2 Films Measurement by Spectroscopic Ellipsometry

WANG Xiao-feng,YANG Jun-bo,CHANG Sheng-li,WANG Fei(National University of Defense Technology,Hunan,Changsha 410073)  
The ellipsometric parameters of MgF2 films in the wavelength range of 300nm~850nm on fused silica are measured by spectroscopic ellipsometer.The dispersion curve of the films is acquired by Levenberg-Marquardt arithmetic.The results show that the refraction index of the films is smaller than that of the bulk materials.
【CateGory Index】: O484.41
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
【References】
Chinese Journal Full-text Database 1 Hits
1 WAN Bu-yong,CUI Yu-ting,FENG Qing(Chongqing Normal University,Chongqing 400047);Optical Constants of Transparent Films Measurement by Spectrophotometer[J];Physical Experiment of College;2011-06
【Citations】
Chinese Journal Full-text Database 1 Hits
1 FU Yan-jun1,2,YANG Kun-tao1,ZOU Wen-dong2,HE Xing-dao2(1.School of Opto-electronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China;2.Laboratory of Nondestructive Test(Ministry of Education),Nanchang Institute of Aeronautical Technology,Nanchaug 330063,China);Image mosaic based on levenberg-marquardt algorithm[J];Laser Journal;2007-05
【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 LAI Xiao-tao et al(School of Information Engineering,Gannan Medical University,Ganzhou,Jiangxi 341000);Polarization Analysis of Mueller Matrix for the Backscattering of Turbid Media[J];Journal of Anhui Agricultural Sciences;2011-16
2 FENG Li shuang,ZHU Lian qing,DONG Ming li (Department of Mech Electronic Engineering,Beijing Intitute of Machinery,Beijing 100085,China);STUDY ON TWO OPTICAI-PATHS POLARIZATION MEASURING SYSTEM[J];JOURNAL OF BEIJING INSTITUTE OF MACHINERY;2000-02
3 Yao Ruoya Cui Xiang Li Changsheng Zhang Weidong(Beijing Electric Power College) (North China Electric Power University);Application of Electrooptic Modulator to Measuring the State of Optical Polarization[J];Journal of Transcluction Technology;1997-02
4 Wang Shanci (The 49th Research Institute of Ministry of Electronies Industry);Sensing Technology Based on Polycryctalline Silicon (Serial two)[J];Journal of Transducer Technology;1994-02
5 MA Yue-jin1,LIAN Jie1,WANG Gong-tang2,YU Xiao-hong1(1.School of Information Science and Engineering,Shandong University,Jinan 250100,China; 2.College of Physics and Electronics of Shandong Normal University,Jinan 250014,China);Optical Absorption Characteristic of Nd Doped Lithium Borate Laser Glass[J];Journal of Materials Science and Engineering;2012-04
6 DENG Yuan-long~{1,2}, YAO Jian-quan~1, RUAN Shuan-chen~2, SUN Xiu-quan~2, WU Yu-bin~2(1. College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China; 2. School of Engineering and Technology, ShenZhen University, ShenZhen 518060,China);Study on Heterodyne Transmission Ellipsometry and Nonlinearity Error[J];Journal of Test and Measurement Technology;2005-03
7 He Huahui; Su jun;Feng Zekun;Chen Yabo;Gong Xuewen (Huazhong University of Science and Technology, Wuhan 430074 );Design and Analysis of a Novel Magneto-Optical Isolator[J];JOURNAL OF MAGNETIC MATERIALS AND DEUICES;1997-01
8 ZHOU Guoan,LIU Bin,WANG Xuejun,CHONG Baochun,ZHAN Yang(The 45th Research Institute of CETC,East Yanjiao,Beijing 101601,China);Study on Measurement and Evaluation of Post-CMP[J];Equipment for Electronic Products Manufacturing;2009-01
9 Huang Zongqing * Zhang Shengtao Xie Shangfen Chen Changguo Yang Yuru Zhu Wei (Dept. of Applied Chem,Chongqing Univ.Chongquing 400044);Spectroellipsometric Studies on Electrochemistry and its Application[J];ELECTROCHEMISTRY;1999-03
10 CAO Chun-bin1 2 3,SUN Zhao-qi2,3,SONG Xue-ping2(1.School of Sciences,Anhui Agricultural University,Hefei,Anhui 230036,China;2.Schoo1 of Physics and Material Science,Anhui University,Hefei Anhui 230039,China;3.Key Laboratory of Opto-electronic Information Acquisition and Manipulation,Ministry of Education,Hefei,Anhui 230039,China);Modeling involvement in teaching process of spectroscopic ellipsometry[J];College Physics;2010-06
China Proceedings of conference Full-text Database 2 Hits
1 Zhang Xueping,Kou Sha,Yan Dongxia,Li Lingjie,Lei Jinglei,Zhang Shengtao(College of Chemistry and Chemical Engineering,Chongqing University,Chongqing,400044);Study on the inhibition mechanism of several inhibitors to carbon steel using in situ ellipsometry[A];[C];2010
2 Zhou Muchun Chen Yanru Zhao Qi Yuan Xingqi Wang Yun (School of Electronic Engineering and Optoelectronic Technology, NUST, Nanjing 210094, China);Study on Dynamic Detection of Polarization States in Laser Guidance[A];[C];2005
【Co-references】
Chinese Journal Full-text Database 5 Hits
1 Shen Weidong,Liu Xu,Zhu Yong,Zou Tong,Ye Hui,and Gu Peifu(State Key Laboratory of Modern Optical Instrumentation,Zhejiang University,Hangzhou 310027,China);Determination of Optical Constants and Thickness of Semiconductor Thin Films by Transmission Measurement[J];Chinese Journal of Semiconductors;2005-02
2 Kong Di Peng Guanliang Yang Jiankun Chang Shengli Yang Juncai (National University of Defense Technology,Changsha,410073);PRINCIPAL TECHNICAL INDEXES OF UV-VIS SPECTROPHOTOMETER AND THEIR VERIFICATION METHODS[J];Physical Experiment of College;2007-04
3 CAO Chun-bin1 2 3,SUN Zhao-qi2,3,SONG Xue-ping2(1.School of Sciences,Anhui Agricultural University,Hefei,Anhui 230036,China;2.Schoo1 of Physics and Material Science,Anhui University,Hefei Anhui 230039,China;3.Key Laboratory of Opto-electronic Information Acquisition and Manipulation,Ministry of Education,Hefei,Anhui 230039,China);Modeling involvement in teaching process of spectroscopic ellipsometry[J];College Physics;2010-06
4 ZHANG Yin-hua,HUANG Wei,ZHANG Yun-dong(Institute of Optics and Electronics,Chinese Academy of Science,Chengdu 610209,China);Optical property of several infrared thin film materials[J];Optical Instruments;2006-04
5 Wang Cheng-Wei 1) Wang Jian 1) Li Yan 1) Liu Wei-Min 2)\ Xu Tao 2) Sun Xiao-Wei 1) Li Hu-Lin 3) 1) (College of Physics and Electronic Engineering,Northwest Normal University,Lanzhou 730070,China) 2) (State Key Laboratory of Solid Lubrication,Lanzhou Institute of Chemical Physics,Chinese Academy of Sciences, Lanzhou 730000,China) 3) (Department of Chemistry,Lanzhou University,Lanzhou 730000,China);Determination of the optical constants of porous anodic aluminum oxide films[J];Acta Physica Sinica;2005-01
【Secondary References】
Chinese Journal Full-text Database 1 Hits
1 CHEN Long-xi1,2,WU Bin2,3 (1.Shandong Youth University of Political Science,Shandong Jinan 250103; 2.Key Lab of information security and intelligent control in Universities of Shandong,Shandong Jinan 250103; 3.Chinese Academy of Sciences,Anhui Hefei 230031);Characters and Application Prospects of Atmospheric Pressure Dielectric-barrier Discharge Studies[J];Physical Experiment of College;2013-01
【Secondary Citations】
Chinese Journal Full-text Database 6 Hits
1 LI Gui-ling 1, WAN Jian-hua 1, TAO Hua-xue 2 (1. Department of Petroleum Resources and Information Science,University of Petroluem,Dongying 257061,China; 2. Shandong University of Science and Technology, Taian 271019,China);Nonlinear Data Processing Based on Improved Marquardt Method[J];Journal of The Pla Institute of Surveying and Mapping;2001-03
2 Li Zhigang, Ji Yubo, Xue Quan (Dept. of Computer Science and Technology, Fushun Petroleum Institute, Fushun 113001 );A Fast Stitching Algorithm for Edge Overlapping Images[J];COMPUTER ENGINEERING;2000-05
3 ZHOU Xian\|tong 1, WANG Bai\|sheng 1, NI Yi\|qing 2(1.Zhejiang University, Hangzhou 310027, China; 2.Department of Civil & Structural Engineering, The Hong Kong Polytechnic University, China);Structural parameter identification using neural network and optimization metho[J];Chinese Journal of Computational Mechanics;2001-02
4 LIU Zhi ming, WANG Zhong xian, SU Hong, ZHU Yu ping (Faculty of Science, Jiangsu University of Science and Technology, Zhenjiang, Jiangsu 212013, China);Prediction of Stress Concentration Based on Levenberg-Marquardt Algorithm[J];Journal of Jiangsu University of Science and Technology;2001-06
5 Zhao Hong 1,Zhou Ruixiang 2,Lin Tingqi 1 (1.School of Mechanical Engineering, Xi′an Jiaotong University, Xi′an 710049, China; 2. The Engineering Institute of the Airforce Engineering University);Neural Network Supervised Control Based on Levenberg-Marquardt Algorithm[J];Journal of Xi'an Jiaotong University;2002-05
6 ZHOU Peng,TAN Yong,XU Shou shi ( Department of Electronic Engineering and Information Science,USTC,Hefei 230027,China );A New Method of Image Registration Based On Corner Detection[J];Journal of University of Science and Technology of China;2002-04
©2006 Tsinghua Tongfang Knowledge Network Technology Co., Ltd.(Beijing)(TTKN) All rights reserved