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《Low Voltage Apparatus》 2009-21
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Design and Analysis for Low Voltage Apparatus Multiple Factor Reliability Experiment

REN Shibin1,CHEN Peng 1,2(1.HUANYU Group Corporation,Wenzhou 325603,China;2.Hebei University of Technology,Tianjin 300130,China)  
Low voltage apparatus reliability experiment was affected by many factors,such as ambient temperature,dampness,current through contactor,operation frequency etc.In this paper,it introduced the theory of taking the orthogonal test principle and method of management to design the tests,and gave an the analysis process of a concrete example.The research indicated that the methodology has unique maths processing function for low voltage apparatus multiple factor reliability experiment.
【CateGory Index】: TM52
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