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《Application of Electronic Technique》 2013-11
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The shock wave overpressure test system based on double flash memory

Zhang Hailong;Ma Tiehua;Xie Rui;Liu Shuanghong;Key Laboratory of Instrumentation Science&Dynamic Measurement,North University of China;Key Laboratory of Electronic Measurement Technology,North University of China;  
A double flash memory test system of shock wave overpressure based on AVR MCU and CPLD is designed to solve the problems of small storage capacity,high power consumption in the traditional shock wave test.In this paper,storage test method and negative delay module are described in detail.CPLD is used to produce high- speed sample signal and MCU is used to control two flashes record the tested signal alternately.The sensor was chosen according to frequency spectrum of measured signal.The analog signal conditioning circuit and digital circuit were designed on the basis of sensor type.Experiments show the system applied in explosion field can complete the detection and storage of shockwave pressure signal.
【CateGory Index】: TP274
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