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《Electronic Product Reliability and Environmental Testing》 2007-03
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Optimized Design for Vibration-proof of Grid for Grid-controlled Electron Gun

ZHANG Yong1,2,HE Xiao-qi1,SONG Fang-fang1 (1. CEPREI,Guangzhou 510610,China; 2. Guangdong University of Technology,Guangzhou 510090,China)  
The grid-controlled electron gun must have a good vibration-proof reliability because of the regulating action of current by grid and the designed structure between the grid and cathode. In the modality analysis of the grid,finite element analysis was used to obtain the different natural frequencies and the vibration models. The factors that affect the natural frequencies were discussed to provide reference for the grid′s optimized design.
【Fund】: 电子元器件可靠性物理及其应用技术国家重点实验室基金项目(51433010104DZ1501)资助
【CateGory Index】: TN124
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【Citations】
Chinese Journal Full-text Database 3 Hits
1 HE Xiao-qi, SONG Fang-fang, LIU Shou-gui, ZHAN Sheng, LU Xiang-ying ( CEPREI, Guangzhou 510610, China; Netional Key Laboratory for Reliability Physics and Application Technology of Electrical Component, Guangzhou 510610, China; Theoretical and Applied Mechanics Department of Sun Yat-sen University, Guangzhou 510275, China; BVERI, Beijing 100016, China);The Model Parameter and the Reliability of the Gridded Gun[J];Electronic Product Reliability and Environmental Testing;2004-01
2 SONG Fang-fang, HE Xiao-qi, TANG Kai, YANG Xu-gui, LV Xiang-ying (Southeast University, Nanjing 210096, China; CEPREI, Guangzhou 510610, China; Zhongshan University, Guangzhou 510275, China; China Electronics Group No.12 Institute, Beijing 100016, China);Dynamical Modal Analysis of TWT Grided Electron Gun[J];Electronic Product Reliability and Environmental Testing;2004-02
3 Wang Bing (Military Industry Base Office,Ministry of Electronics Industry,Beijing 100846) Su Zhenhua (No.5 Research Institute,Ministry of Electronics Industry,Guangzhou 510610);Current Status and Difference of TWTs Reliability[J];VACUUM ELECTRONICS;1999-01
【Co-citations】
Chinese Journal Full-text Database 7 Hits
1 SONG Fang-fang, HE Xiao-qi, TANG Kai, YANG Xu-gui, LV Xiang-ying (Southeast University, Nanjing 210096, China; CEPREI, Guangzhou 510610, China; Zhongshan University, Guangzhou 510275, China; China Electronics Group No.12 Institute, Beijing 100016, China);Dynamical Modal Analysis of TWT Grided Electron Gun[J];Electronic Product Reliability and Environmental Testing;2004-02
2 HE Xiao-qi(CEPREI,Guangzhou510610,China);The Failure Analysis and Control Method of NTC Thermistor[J];Electronic Product Reliability and Environmental Testing;2004-04
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4 ZHOU Xi,YAO Lie-ming (School of Physical Electronics,University of Electronic Science and Technology of China,Chengdu 610054,China);Dynamic modal analysis of circular-radial grid and its second development[J];Journal of Xi'an University of Post and Telecommunications;2006-05
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6 ZHU Qiang-hua,JIN Guo-qing,RUAN Xiao-fen(College of Electronic Engineering,Naval University of Engineering,Wuhan 430033,China);Design of a General Automatic TWT Aging Equipment[J];Vacuum Electronics;2006-06
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【Co-references】
Chinese Journal Full-text Database 8 Hits
1 ;构建基于ANSYS的行波管分析和设计平台及探讨[J];Journal of Chengdu Electro-mechaical College;2004-03
2 HE Xiao-qi, SONG Fang-fang, LIU Shou-gui, ZHAN Sheng, LU Xiang-ying ( CEPREI, Guangzhou 510610, China; Netional Key Laboratory for Reliability Physics and Application Technology of Electrical Component, Guangzhou 510610, China; Theoretical and Applied Mechanics Department of Sun Yat-sen University, Guangzhou 510275, China; BVERI, Beijing 100016, China);The Model Parameter and the Reliability of the Gridded Gun[J];Electronic Product Reliability and Environmental Testing;2004-01
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【Secondary Citations】
Chinese Journal Full-text Database 5 Hits
1 HE Xiao-qi, SONG Fang-fang, LIU Shou-gui, ZHAN Sheng, LU Xiang-ying ( CEPREI, Guangzhou 510610, China; Netional Key Laboratory for Reliability Physics and Application Technology of Electrical Component, Guangzhou 510610, China; Theoretical and Applied Mechanics Department of Sun Yat-sen University, Guangzhou 510275, China; BVERI, Beijing 100016, China);The Model Parameter and the Reliability of the Gridded Gun[J];Electronic Product Reliability and Environmental Testing;2004-01
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