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《Chinese Journal of Electron Devices》 2014-01
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Micro Dynamic Stress Storage Measurement System Based on MCU and CPLD

ZHANG Hailong;MA Tiehua;XIE Rui;LIU Shuanghong;Key Laboratory of Instrumentation Science and Dynamic Measurement,North University of China;Key Laboratory for Electronic Measurement Technology,North University of China;  
A stress storage microsystem is introduced to slove the problem of Vehicle Track dynamic stress measurement. The bridge method is used to test stress signal collected by a strain type pressure transducer and storage testing technology is designed in this measurement system. With low loss MCU and CPLD as main chips lowpower of the control system is realized. Analog circuit and digital circuits are designed,The cantilever-beam impact experiment show that experimental results differ,from theoritical calculation by less than 7%. So,this system can be adopted in stress measurements of Vehicle track.
【CateGory Index】: U469.694;U467.4
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