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The Electron-Optics Analysis of the Deflection Structure in the Electron Beam Scanning FCRT

Nie Shiqi;Lin Shuquan;Huang Baolin (HDN Institute,Shanghai Jiaotong University,Shaphai 200030)  
In the electron beam scanning flat CRT, the electron beam usully is deflected several times. This paper analyses the deflection structure of FCRT. The electric field expression of the structure is given. From the variation equation, the Gauss trajection equation in the deflected optical axis coordinate is given. By comuter calculation, the factors affecting electron beam deflection is analysed.
【Fund】: 国家“八五”重点攻关项目
【CateGory Index】: TN141.3
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