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《ACTA ELECTRONICA SINICA》 1998-09
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The Electron-Optics Analysis of the Deflection Structure in the Electron Beam Scanning FCRT

Nie Shiqi;Lin Shuquan;Huang Baolin (HDN Institute,Shanghai Jiaotong University,Shaphai 200030)  
In the electron beam scanning flat CRT, the electron beam usully is deflected several times. This paper analyses the deflection structure of FCRT. The electric field expression of the structure is given. From the variation equation, the Gauss trajection equation in the deflected optical axis coordinate is given. By comuter calculation, the factors affecting electron beam deflection is analysed.
【Fund】: 国家“八五”重点攻关项目
【CateGory Index】: TN141.3
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【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 WANG Chao1,TANG Tian-tong1,KANG Xiao-hui2(1.Key Laboratory of Electronic Physics and Device of Ministry of Education,Xi'an Jiaotong University,Xi'an 710049,China;2.Department of Computer,Xidian University,Xi'an 710071,China);Modulating properties of electrostatic immersion objective laminar flow gun[J];High Power Laser and Particle Beams;2008-04
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3 Zhou Kaiyu Zhuang Binghe Wu YongWei (The 48th Research Institute of the Ministry of Machinery and Electronics Industry, Changsha 410111);APPLICATON OF LaB_6 CATHODE IN ELECTRON BEAM LITHOGRAPHY SYSTEMS[J];Microfabrication Technology;1992-03
4 LIU Qiu yi (Forty Eighth Electronics Institute of MII Chang sha 410111, China);Columm Optics And Mechanism of a Submicron Electron Beam Lithography System[J];Microfabrication Technology;2000-04
5 Wang Chen; Yin Hanchun; Tong Linsu (Electronics Research Institute,Southeast University, Nanjing 210096 );Fully Three-Dimensional Numerical Calculation of Electric Field[J];VACUUM ELECTRONICS;1996-02
6 Zhang Xiaobing;Tong Linsu;Yin Hanchun;Tu Yan (Southeast University, Nanjing, 210096);MULTIPOLE FIELD APPLICATION TO ANALYSIS AND CORRECTION OF THE SEVENTH-ORDER ABERRATION[J];;1996-02
7 Wang Liping; Tang Tiantong (Department of Optical and Physical Electronic Engineering, Xi'an Jiaotong University, Xi'an,710049);The Calculation of Defect Fields of Electrostatic Lenses Based on the Perturbation Theory[J];;1998-06
8 Cheng Min,Tang Tiantong Department of Electronic Science and Technology Engineering,School of Electronics and Information Engineering,Xi'an Jiaotong University,Xi'an,710049;Theory and Numerical Modeling of Magnetic Immersed Lenses without Crossover[J];;2000-05
9 Cheng Min,Tang Tiantong,Yao Zhenhua Department of Electronics Science and Technology Engineering,School of Electronics and Information Engineering,Xi'an Jiaotong University,Xi'an,710049,China;Study of Time of Flight of Sector Uniform Magnetic Analyzers[J];;2002-02
10 Tang Tiantong *,Kang Yongfeng and Wang Zhaohong (School of Electronic and Information Engineering,Xi'an Jiaotong University,Xi'an,710049,China);Initial Thermal Velocity Distribution and Evaluation of High Current Density Electron Beam Focussed by Magnetic Field[J];Chinese Journal of Vacuum Science and Technology;2004-03
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