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《Acta Electronica Sinica》 2009-08
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A Test Data Compression Scheme Based on Mixed Fixed and Variable Run-length Coding in Virtual Block

ZHAN Wen-fa~(1,2),LIANG Hua-guo~1,SHI Feng~1,HUANG Zheng-feng~1 (1.School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China; 2.Department of Educational Technology,Anqing Normal College,Anqing,Anhui 246011,China; 3.School of Electronic Science and Applied Physics,Hefei University of Technology,Hefei,Anhui 230009,China)  
A test data compression scheme based on mixed fixed and variable run-length coding in virtual block(MFVR-CVB) is presented.In the scheme the test vectors are concatenated to a stream first and then this stream is divided fixed length block.In every block the one-bit-representation or the maximum one-bit-representation is search to reduce the number and length of runs.Then the left data in every block is encoded by using the run-length encoding.This reduces the volume of data needed to be encoded and breaks the limitation by the volume of original test data in tranditional run-length schemes.Experimental results show that the proposed scheme obviously outperforms the traditional coding methods in the compression ratio,such as Golomb,FDR,VI-HC, v9C coding.
【Fund】: 国家自然科学基金重点项目(No.60633060);; 国家自然科学基金(No.60876028);; 教育部博士点基金(No.200803590006);; 安徽省海外高层次人才(No.2008Z014)
【CateGory Index】: TN406
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【Citations】
Chinese Journal Full-text Database 3 Hits
1 HAN Yin-he,LI Xiao-wei,XU Yong-jun,LI Hua-wei (Institute of Computing Technology,Chinese Academy of Sciences,Beijing 100080,China;Graduate School of Chinese Academy of Sciences,Beijing 100039,China);Test Resource Partitioning Using Variable-Tail Code[J];Acta Electronica Sinica;2004-08
2 FANG Jian-ping,HAO Yue,LIU Hong-xia,LI Kang(Key lab of ministry of education for wide Band-Gap Semiconductor Materials andDevices School of Microelectronic,Xidian University,Xi'an,Shaanxi 710071,China);A Hybrid Run-Length Coding for Soc Test Data Compression[J];Acta Electronica Sinica;2005-11
3 LIANG Hua-Guo 1) JIANG Cui-Yun 2) 1) (Institute of Computer and Information, Hefei University of Technology, Hefei 230009) 2) (Department of Information and Computing Science, Hefei University of Technology, Hefei 230009);Efficient Test Data Compression and Decompression Based on Alternation and Run Length Codes[J];Chinese Journal of Computers;2004-04
【Co-citations】
Chinese Journal Full-text Database 10 Hits
1 FANG Xiang-Sheng~1,CHAO Xian-Xia~2(1.Anhui Economy Administration Institute,Hefei 230059,China;2.Anhui Highway Engineering Artificer School,Hefei 230051,China);Testing research for the SOC logic BIST[J];Journal of Anhui Institute of Architecture & Industry(Natural Science);2006-03
2 LU Jun1,2,LIU Da-xin1,CHEN Li-yan2(1.College of Computer Science and Technology,Harbin Engineering University,Harbin 150001,China;2.College of Computer Science and Technology,Heilongjiang University,Harbin 150080,China);Compression method with constant degree based on permutation and combination[J];Journal of Dalian Maritime University;2008-04
3 Liu Jie1,2 Liang Huaguo1 Xu Sanzi1 (1. School of Computer and Information, Hefei University of Technology, Hefei 230009, China; 2. School of Physics and Electronic Science, Fuyang Normal College, Fuyang 236041, China);Test data compression technology based on blocking code and optimal sort algorithm[J];Journal of Electronic Measurement and Instrument;2009-05
4 FANG Jian-ping,HAO Yue,LIU Hong-xia,LI Kang(Key lab of ministry of education for wide Band-Gap Semiconductor Materials andDevices School of Microelectronic,Xidian University,Xi'an,Shaanxi 710071,China);A Hybrid Run-Length Coding for Soc Test Data Compression[J];Acta Electronica Sinica;2005-11
5 PENG Xi-yuan,YU Yang(Department of Automatic Test and Control,Harbin Institute of Technology,Harbin,Heilongjiang 150001,China);A Test Set Compression Algorithm Based on Variable-Run-Length Code[J];Acta Electronica Sinica;2007-02
6 OUYANG Yi-ming,CHENG Li-li,LIANG Hua-guo (School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China);A New Test Data Compression and Decompression Technique Based on Statistic Relativity of Variable Length Data Block[J];Acta Electronica Sinica;2008-02
7 FANG Hao,YAO Bo,SONG Xiao-di,CHENG Xu (Room 1815,Science Building 1,Peking University,Beijing 100871,China);The Algorithm of Filling X Bits in Dual-Run-Length Coding[J];Acta Electronica Sinica;2009-01
8 Zhang Lei,(School Lofi aCnogm pHutuear ganudo I,nfToramoa tJioun,eHheufeii University of Technology,Hefei,230009);A Generalized Alternating Run-Length Coding Based On Test Set Partition[J];Electronics Quality;2007-08
9 Wang Zenghui Lei Jia (College of Electronic Engineering,Guilin University of Electronic and Technology,Guilin 541004,China);Variant of run-length coding of test data compression method[J];Foreign Electronic Measurement Technology;2009-05
10 FANG Hao,SONG Xiaodi,CHENG Xu Department of Computer Science and Engineering,School of Electronics Engineering and Computer Science,Peking University,Beijing 100871;CacheCompress:A Novel Approach for Test Compression for IP Cores[J];Acta Scientiarum Naturalium Universitatis Pekinensis;2009-05
【Secondary Citations】
Chinese Journal Full-text Database 2 Hits
1 HAN Yin-he,LI Xiao-wei,XU Yong-jun,LI Hua-wei (Institute of Computing Technology,Chinese Academy of Sciences,Beijing 100080,China;Graduate School of Chinese Academy of Sciences,Beijing 100039,China);Test Resource Partitioning Using Variable-Tail Code[J];Acta Electronica Sinica;2004-08
2 LIANG Hua Guo ①, Sybille Hellebrand ②, and Hans Joachim Wunderlich ③ ①(Department of Computer and Information, Hefei University of Technology, Hefei 230009) ②(Institute of Applied Computer Science, University of Innsbruck, Innsbruc;A DETERMINISTIC BIST SCHEME BASED ON RESEEDING OF FOLDING COUNTERS[J];Journal of Computer Research and Development;2001-08
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