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《Acta Electronica Sinica》 2012-02
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Test Data Compression for Multiple Scan Chains with Dynamic Vector Adjustment

LIU Jie1,2,LIANG Hua-guo1,3,YI Mao-xiang3,ZHAO Fa-yong2(1.School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China;2.School of Physics and Electronic Science,Fuyang Normal College,Fuyang,Anhui 236041,China;3.School of Electronic Science and Applied Physics,Hefei University of Technology,Hefei,Anhui 230009,China)  
Test schemes with multiple scan chains can speed up test schedule and are more fitting for testing VLSI,and hence a test data compression scheme is proposed and applied to multiple scan chain testing.Treatment model of cyclic shift introduced can dynamically adjust reference vectors,retain don't care bits in vectors and increase extensions of test vectors,and thus compatibility and inverse compatibility between vectors can be heightened.At the same time,an efficient technique for replacement of reference vectors can be exploited to further heighten correlations between vectors and decrease number of code words.Moreover,existing shift registers can be utilized to lower unnecessary hardware overhead.The experiment results demonstrate that the proposed scheme can further improve test compression ratios,meet deterministic fault test and hybrid built-in self test under maintaining advantages of multiple scan chain testing.
【Fund】: 国家自然科学基金重点项目(No.60633060) 国家自然科学基金(No.60876028);; 教育部博士点基金(No.200803590006);; 安徽省海外高层次人才基金(No.2008Z014);; 安徽省高校省级自然科学研究基金(No.KJ2010B428 No.KJ2010A280)
【CateGory Index】: TN407
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【Citations】
Chinese Journal Full-text Database 3 Hits
1 FANG Hao,YAO Bo,SONG Xiao-di,CHENG Xu (Room 1815,Science Building 1,Peking University,Beijing 100871,China);The Algorithm of Filling X Bits in Dual-Run-Length Coding[J];Acta Electronica Sinica;2009-01
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3 LIU Jun1,2,3,WU Xi1,HAN Yin-he2,3,LI Xiao-wei2,3(1.School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China;2.Key Laboratory of Computer System and Architecture,Institute of Computing Technology,Chinese Academy of Sciences,Beijing 100190,China;3.Graduate University of Chinese Academy of Sciences,Beijing 100490,China);Low Power Test Data Compression Technique Based on Reconfigurable MUXs Network[J];Acta Electronica Sinica;2011-05
【Co-citations】
Chinese Journal Full-text Database 4 Hits
1 LIU Jun1,2,3,WU Xi1,HAN Yin-he2,3,LI Xiao-wei2,3(1.School of Computer and Information,Hefei University of Technology,Hefei,Anhui 230009,China;2.Key Laboratory of Computer System and Architecture,Institute of Computing Technology,Chinese Academy of Sciences,Beijing 100190,China;3.Graduate University of Chinese Academy of Sciences,Beijing 100490,China);Low Power Test Data Compression Technique Based on Reconfigurable MUXs Network[J];Acta Electronica Sinica;2011-05
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4 SHANG Jin1,2,ZHANG Li-yong1 (1.School of Measure-control Technology and Communication Engineering,Harbin University of Science and Technology,Harbin 150080,China;2.Department of Electronic Engineering,Heilongjiang Institute of Technology,Harbin 150050,China);A Test Data Compression Scheme Based on Mixed Compatible Data Blocks[J];Journal of Harbin University of Science and Technology;2011-06
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