Full-Text Search:
Home|Journal Papers|About CNKI|User Service|FAQ|Contact Us|中文
Add to Favorite Get Latest Update

Towards property nanomeasurements by in-situ TEM-present and prospects

WANG Zhong\|lin (School of Materials Science and Engineering Georgia Institute of Technology Atlanta GA 30332\|0245 USA)  
Property characterization of nanomaterials is challenged by the small size of the structures because of the difficulties in minuapilation. To carry out the property measurements of a single nanostructure (e.g., a single particle, fiber or tubule), one must be able to directly see the object. Here we demonstrate a novel approach that allows a direct measurement of the mechancial, electrical and thermaldynamic properties of individual nanostructures by in\|situ transmission electron microscopy (TEM). The technique is powerful in a way that it directly correlates the atomic\|scale microstructure of the nanostructure with its physical properties, thus, providing a complete one\|to\|one characterization of the nanomaterials. This is a direction of future electron microscopy towards nanomeasurements. The future prospects of this field will be discussed.
【CateGory Index】: TB383
Download(CAJ format) Download(PDF format)
CAJViewer7.0 supports all the CNKI file formats; AdobeReader only supports the PDF format.
Chinese Journal Full-text Database 1 Hits
1 Chen Benyong1 Li Dacheng2 1 (Center of Nanotechnology, Zhejiang Sci-Tech University, Hangzhou 310018,China) 2 (State Key Lab of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084,China);Challenges and Opportunities of Nanomeasurement Technology[J];Chinese Journal of Scientific Instrument;2005-05
Chinese Journal Full-text Database 5 Hits
1 ZHANG Kai-liang 1 ,LIU Yu-ling 1 ,WANG Fang 2(1.Institute of Microelectronic Technology&Materials,Hebei University of Technology,Tianjin300130,China;2.Department of Photoelectronics,Tianjin University of Technology,Tianjin300191,China);Development of semiconductor device and research of solid nanoelectron device[J];Semiconductor Information;2003-01
2 Zhang Yiyi; He Jie; Shang Guangyi;Yao Junen(Beijing Laboratory of Electron Microscopy,Academia Sinica,Beijing100080);An Atomic Force Microscope[J];ACTA OPTICA SINICA;1995-01
3 Xu Yi, Ye Xiaoyou, Li Chengyang, Xu Jie, Cao Feng (National Institute of Metrology, Beijing 100013);A Fabry-Perot Interferometer for Measuring Micro-Displacement[J];Acta Metrologica Sinica;1993-02
4 Jiang Zhongyi\ Wang Yanqiang (School of Chemical Engineering and Technology Tianjin University Tianjin\ 300072,China);Nanobiotechnology:Opportunities and Challenges[J];Progress In Biotechnology;2002-06
5 Wang, Chun-he Ye, Sheng-hua Tianjin University;The Dual Fabry-perot Fibre Interferomter and the Fringe Location Method[J];Chinese Journal of Scientific Instrument;1994-01
【Secondary References】
Chinese Journal Full-text Database 1 Hits
1 CHANG Tong-qin(Department of Technical Physics,Zhengzhou Institute of Light Industry,Zhengzhou 450002,China);Measurement and Characterization of Nanomaterial[J];Micronanoelectronic Technology;2006-10
©2006 Tsinghua Tongfang Knowledge Network Technology Co., Ltd.(Beijing)(TTKN) All rights reserved