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《Chinese Journal of Analytical Chemistry》 1992-08
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Tungsten Spiral Electrothermal Vaporization Sample Introduction-Inductively Coupled Plasma Atomic Emission Spectrometry for the Determination of Trace Elements

Mei Erwen; Jiang Zucheng~*; Liao Zhenhuan(Department of Chemistry, Wuhan University, Wuhan 430072)  
A device with tungsten-spiral electrothermal vaporization for sample introduction into inductively coupled plasma-atomic emission spectrometry has been designed. Several influence factors including vaporization voltage, carrier gas flow. rate, the Volume of valporization chamber and the working condition of the instrument were investigated. Under optimal experimental conditions, the detection limits of Ni, Co, Fe, Cr, Mn, Cu, Mg were betwlen the Order of 10~(-9)~10~(-11) g. The relative standard deviation was below 5%.
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