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《Journal of Engineering Thermophysics》 2013-02
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Measurement of Infrared Emissivity of Surfaces With Non-Uniform Millimeter-Scale Roughness

LIU Hua~1 AI Qing~1 XIA Xin-Lin~1 WANG Zheng-Yu~2 ZHANG Li-Na~2 YU Ming-Xing~2 (1.School of Energy Science and Engineering,Harbin Institute of Technology,Harbin 150001,China; 2.Beijing Institute of Nearspace Vehicle's Systems Engineering,Beijing 100076,China)  
An experimental device was built to isothermally measure the infrared emissivity of a surface with non-uniform millimeter-scale roughness.The surface temperature are measured by the thermocouples and a thermal imager,respectively.And the emissivity formula for applying the dual temperature measurement data was deduced.After validating the reliability of the experiment,a typical PCB with the non-uniform millimeter-scale rough surface was measured to obtain the infrared emissivity distribution with a measuring uncertainty of 2.11%.The investigation shows that the measuring method is convenient and reliable.
【Fund】: 国家自然科学基金(No.51176038;No.51106036);; 中央高校基本科研业务费专项资金(No.HIT.NSRIF.2010029)
【CateGory Index】: TK12
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