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Improvement for Measuring Accuracy of Fourier Transform Profilometry with Gray Image

CHEN Wen jing, SU Xian yu, SU Li kun LI Wan song, XIANG Li qun (Department of Opto Electronics,Sichuan University,Chengdu 610064,China)  
In Fourier transform profilometry,π phase shift is often used to eliminate zero frequency for avoiding spectral mixing and overlapping,thus the measuring accuracy can be improved.But a phase shift device is included in the measuring system and the system complexity is increased.However,people often ignore the functions of information included in gray image in Fourier transform profilometry.A method for improving the measuring accuracy by applying a frame of gray image to Fourier transform profilometry is proposed in the paper.The constitution of the measuring device for this method is simple and it can achieve the effect of π phase shift.It is significant in the practical Fourier transform profilometry.
【Fund】: 博士点基金资助项目
【CateGory Index】: TP274
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