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《Opto-electronic Engineering》 2002-01
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A New Method for Improving Measuring Accuracy of Fourier Transform Profilometry

CHEN Wen-jing, SU Xian-yu (Department of Opto-Electronics, Sichuan University, Chengdu 610064, China)  
A "fence effect" is existed in Discrete Fourier Transform (DFT) operation carried out for the discrete fringes in Fourier transform profilometry. The discrete Fourier spectrum cannot entirely represent the original continuous spectrum distribution. This corresponds to result in the loss of spectrum information in the frequency domain. In order to decrease the phase error introduced by "fence effect", the measuring accuracy can be improved through numerically weighting for the fringes in spatial domain and extrapolation zero filling method. The computer simulation demonstrates the effectiveness of the proposed method.
【Fund】: 自然科学基金资助项目(69827001)
【CateGory Index】: TP391.4
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