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《Optoelecfronic Technology》 1992-01
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Theoretical Analysis of Decay of MCP Gain

Tao Zhaomin Wei Yayi (Institute of Electronics, Academia Sinica)  
From the experimental results performed by authors and other workers, the causes of the decay of MCP gain after bombarding by electrons have been analysed. Several factors which effect the decay of MCP gain have been discussed, and the corresponding suggestions have been presented.
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【References】
Chinese Journal Full-text Database 1 Hits
1 Wei Yayi Tao Zhaomin (Institute of Electronics,Academia Sinica);A New Suggestion on High Gain MCP[J];Optoelecfronic Technology;1992-04
【Co-references】
Chinese Journal Full-text Database 1 Hits
1 Wei Yayi(Institute of Electronics, Academia Sinica, Beijing 100080);STUDY OF THE SURFACE STRUCTURE OF LEAD SILICATE GLASS REDUCED BY HYDROGEN[J];;1992-06
【Secondary References】
Chinese Journal Full-text Database 1 Hits
1 Wei Yayi Tao Zhaomin(Institute of Electronics Academia Sinica. Beijing 100080);THEORETICAL ANALYSIS OF MCP NOISE FACTOR[J];;1993-06
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