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《Journal of Optoelectronics.Laser》 2011-05
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Application of spherical bent crystal analyzer in X-ray plasma diagnosis

LIU Li-feng1,XIAO Sha-li1,WU Yu-fen1,LIU Shen-ye2,WEI Min-xi2,CHEN Bo-lun2,QIAN Jia-yu1(1.Key Laboratory of Optoelectronic Technology and System,Ministry of Education,ChongqingUniversity,Chongqing 400030,China;2.Research Center of Laser Fusion,CAEP,Mianyang 621900,China)  
In order to diagnose X-ray emitted from the plasma under high temperature,a novel spherical bent crystal analyzer was developed based on X-ray Bragg diffraction theory where the diffraction crystal is α-quartz and the bent radius is 250 mm.The detector(including image plate and Kodak direct exposure X-ray film) was used to obtain the X-ray spectra of Cu plasma and Ti plasma separately with spherical bent crystal analyzer in the X-ray diffraction and the Z pinch implosion.The experimental results show that the both spectra resolutions of spherical bent quartz crystal analyzer are better than 1 000.The spectrum bandwidth of Ti plasma is approximately 0.43 eV.The spherical bent quartz crystal analyzer is suitable for X-ray plasma diagnosis in Z pinch implosion.
【Fund】: 国家自然科学基金委员会&中国工程物理研究院联合基金资助项目(10976033)
【CateGory Index】: O536
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