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Determination of Cu,Ni and Sn in Wastewater of Manufactory of Circuit Board by ICP-OES

Long Jia-Hong Xu Xiong-Fei Kang Xiao-Yu Wu Yin-Ju Tan Ju Zhu Yi (Changsha Environmental Monitoring Centre,Changsha 410001,P.R.China)  
A method was developed for the determination of Cu,Ni and Sn in wastewater of manufactory of circuit board by inductively coupled plasma optical emission spectrometry(ICP-OES), and the chooses of digestion and analytical spectral line were investigated.There was no significant difference between this method and national standard atomic absorption spectrometry(AAS).The method was applied to determine the wastewater of different concentration circuit board,and the detection limits of Cu,Ni and Sn were respectively 0.006,0.005mg/L and 0.008mg/L,and additional standard recoveries for 3 elements were 91.6%-102.6%,93.0%-105.0%and 92.6%-101.8%,respectively,while the relative standard deviations of Cu,Ni and Sn were respectively 0.7%-2.6%,1.5%-4.5%and 1.1%-3.2%.
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