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《Optics and Precision Engineering》 2002-05
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The latest development of optical non-contact 3D profile measurement

CHEN Xiao-rong, CAI Ping, SHI Wen-kang(Shanghai Jiaotong University, Shanghai 200030, China)  
D profile measurement is becoming a powerful tool for obtaining the form and structure of an object. It has important significance and widespread applications in machine vision, automatic measurement, industrial inspection, quality control, etc. Because of the advantages of high resolution, non-distruction, and quick data-obtaining, etc., it is thought to have a great future. This paper introduces some new techniques of the 3D profile measurement such as the light-section method, MMD method, and emphasizes the grating projection measurement method, giving both their advantages and disadvantages, as well as the current hot points and future directions of the last one.
【CateGory Index】: TH741
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