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《Optics and Precision Engineering》 2010-11
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Test and evaluation of wavefront phase of point diffraction

MA Dong-mei 1,CHEN Tu-quan1,2 (1.Changchun Institute of Optics,Fine Mechanics and Physic, Chinese Academy of Sciences,Changchun130033,China; 2.Graduate University of Chinese Academy of Sciences,Beijing100039,China)  
A testing method was proposed for the diffraction wavefront produced by apinhole mounted in a point-diffraction interferometer.The producing principle of the point diffraction wavefront was presented,and the relation among the pinhole states,illumination adjustment and the wavefront aberration was analyzed.On the basis of the fundamental theory of information optics,the Fourier transform and an iterative algorithm were used to calculate and analyze the pinhole diffuse image,retrieve the phase of diffraction wavefront and then to obtain the wavefront information.The related theory was discussed and the measured point diffraction image was analyzed through a computing software of phase retrieval.Results indicate that the output phase tends to a convergence after about 15iterations,and the image error factor has dropped to 0.12.The testing method has been applied to the selection of pinholes and the assembly of pinhole illumination systems,and experimental results prove that the testing method is valid.
【Fund】: 中科院长春光学精密机械与物理研究所创新基金资助项目
【CateGory Index】: O436.1
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