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《OPTICS AND PRECISION ENGINEERING》 1994-03
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Ways to Improve Operating Characteristics of MCP

Guo Hongchang(Depa.Of Physics , Toghua Teachers College, Toighua 134002)Jiang Delong,Wu Kui(Changchun Institne of Optics and Fine Mechanics , Changchun,130022)  
In this paper,we report and review some technical ways to further improve the characteristic of electron image and to increase the detecting ablilty of devices through lowering thenoise of MCP, decreasing the feedback of positive ions and broadening the dynamic ranges.Recent experimental results are shown and necessary analysis is made.
【CateGory Index】: TN15
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