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《Acta Optica Sinica》 2011-07
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Determination of Optical Constants of LaF_3 Films from Spectrophotometric Measurements

Guo Chun1,2 Lin Dawei1 Zhang Yundong1 Li Bincheng1(1Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu,Sichuan 610209,China 2Graduate University of Chinese Academy of Sciences,Beijing 100049,China)  
A homogeneous model for extracting the optical constants of a weakly absorbing film,which is based on the envelope of the transmittance spectrum,has been developed.Expressions are given to correct the spectrum measurements of the thin film to eliminate the effects due to the reflectance from the rear surface of the substrate.Moreover,a simple approach for determining the optical constants of the substrate is also described.For a LaF3 film deposited on CaF2 substrate by Mo-boat evaporation,the optical constants of the as-deposited and ultraviolet(UV)-treated 40 min LaF3 films and CaF2 substrate in the wavelength region from 160 to 340 nm are obtained.The experimental results indicate that UV-treatment can improve the optical properties(increase the refractive index and reduce the extinction coefficient) and reduce the physical thickness of the LaF3 film.
【CateGory Index】: O484.41
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【Citations】
Chinese Journal Full-text Database 2 Hits
1 Zhou Yi Wang Aiying(Ningbo Institute of Material Technology and Engineering,Chinese Academy of Sciences,Ningbo,Zhejiang 315201,China);Determination of Optical Constants and Thickness of Diamond-Like Carbon Films by a Multiple Sample Method[J];Acta Optica Sinica;2010-08
2 Xue Chunrong~(1,2,3) Yi Kui~1 Qi Hongj~1 Fan Zhengxiu~1 Shao Jianda~1(1 Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Siences, Shanghai 201800, China2 Jiangsu Laboratory of Advanced Functional Materials, Changshu Institute of Technology,Changshu, Jiangsu 215500, China3 National Synchrotron Radiation Laboratory, University of Science and Technology of China,Hefei, Anhui 230026, China);Optical Constants of Film Materials for Deep Ultraviolet/Ultraviblet[J];Chinese Journal of Lasers;2009-08
【Secondary Citations】
Chinese Journal Full-text Database 10 Hits
1 Yuan Jingmei Tang Zhaosheng Qi Hongji Shao Jianda Fan Zhengxiu (Research and Development Center for Optical Thin Film Coatings, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800) (Received 28 June 2002; revised 5 September 2002);Analysis of Optical Property for Several Ultraviolet Thin Film Materials[J];Acta Optica Sinica;2003-08
2 Han JiecaiTan ManlinZhu JiaqiCheng KunMeng Songhe (Center of Composite Materials, Harbin Institute of Technology, Harbin 150001);Properties of Tetrahedral Amorphous Carbon Films Characterized By X-Ray Reflectivity Technique[J];Acta Optica Sinica;2005-04
3 Fan Ping~(1,2) Shao Jianda~2 Yi Kui~2 Qi Hongji~2 Fan Zhengxiu~21 School of Science,Shenzhen University,Shenzhen 5180602 Shanghai Institute of Optics and Fine Mechanics,the Chinese Academy of Sciences,Shanghai 201800;Optical Constants of Ion Beam Sputtering Deposited Copper Films of Different Thickness[J];Acta Optica Sinica;2006-06
4 Zhu Jingtao1 Zhang Shumin1 Wang Bei1 Wu Wenjuan1 Li Cunxia1 Xu Yao1Zhang Zhong1 Wang Fengli1 Wang Zhanshan1 Chen Lingyan1Zhou Hongjun2 Huo Tonglin21 Institute of Precision Optical Engineering and Technology, Tongji University,Shanghai 2000922 Nantional Synchrotron Radiation Laboratory,University of Science and Technology of China,Hefei 230029;SiC/Mg Multilayer Film Reflective Mirror at 30.4 nm[J];Acta Optica Sinica;2007-04
5 Cui Yun1,2 Zhao Yuan'an1 Jin Yunxia1 Fan Zhengxiu1 Shao Jianda1 1 Shanghai Institute of Optics and Fine Mechanics,the Chinese Academy of Scicences,Shanghai 201800 2 Graduate School of the Chinese Academy of Sciences,Beijing 10039;Laser Damage Characteristic of Third Harmonic Separator at 1064nm[J];Acta Optica Sinica;2007-06
6 Sun Zhaoqi1,2 Cao Chunbin1,2,3 Song Xueping1,2 Cai Qi1,21School of Physics and Material Science,Anhui University,Hefei,Anhui 230039,China2Key Laboratory of Photo-Electronic Information Acquisition and Manipulation,Ministry of Education,Hefei,Anhui 230029,China3School of Sciences,Anhui Agricultural University,Hefei,Anhui 230036,China;Study on Ellipsometric Spectra of ITO Film[J];Acta Optica Sinica;2008-02
7 Zhang Deheng1 Xu Zhaofang2 Li Boxun21Shanghai Morgan Carbon Co.Ltd.,Shanghai 200241,China2School of Physics Science and Technology,Central South University,Changsha,Hunan 410083,China;Studay on Optical Property of DLC/Ag/DLC Multilayer Films[J];Acta Optica Sinica;2008-10
8 CHEN Yan-ping,YU Fei-hong(State Key Laboratory of Modern Optical Instrumentation,Zhejiang University,Hangzhou 310027,China);Test methods for film thickness and optical constants[J];Optical Instruments;2006-06
9 YANG Kun1,2 WANG Xiangzhao1 BU Yang1 1 Shanghai Institute of Optics and Fine Mechanics,The Chinese Academy of Sciences,Shanghai 201800;2 Graduate University of Chinese Academy of Sciences,Beijing 100039;Research Progress of Ellipsometer[J];Laser & Optoelectronics Progress;2007-03
10 YUAN Jing mei, YI Kui, QI Hong ji, FAN Zheng xiu, SHAO Jian da (R & D Center for Optical Thin Film Coatings, Shanghai Institute of Optics and Fine Mechanics, The Chinese Academy of Sciences, Shanghai 201800, China);Design of 193 nm Optical Thin Films under Practical Structure and Optical Parameters[J];Chinese Journal of Lasers;2004-04
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