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《INFRARED TECHNOLOGY》 2000-01
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Measurement of True Temperature and Emissivity Distribution of Electronic Devices with Infrared Thermal Imaging System

ZHU De zhong 1,GU Yu qin 1, JIN Hong shi 1, HAO Jun 2, LI Hong song 1 (1.Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China; 2.Beijing Microelectronics Technology Institute, Beijing 100076, China)  
The thermograph obtained by a thermal imaging system is only the distribution of radiant temperature of the surface of measured devices,not the true temperature. In this paper, a set of developed system for determining thermal radiation character of electronic devices is introduced, with which the distribution of true temperature and emissivity can be obtained conveniently.By a series of measured results, the feasibility of this system can be proved.
【CateGory Index】: TN219
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